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Test circuit capable of implanting time-domain fluttering and related testing method

A test circuit and injection technology, applied in electrical components, transmission monitoring, receiver monitoring, etc., can solve the problems of unaffordability, cost burden, and high research and development costs, and achieve the effect of reducing test costs

Active Publication Date: 2006-03-01
VIA TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the technical threshold and R&D cost of manufacturing this high-speed test machine 120 will be very high and unaffordable; if the test machine is externally connected to existing high-speed test instruments, such as Agilent BistAssist or Teradyne SPQ, etc., although it can be injected into the loop Time domain jitter can be tested completely, but the high cost of these external high-speed test instruments will form a cost burden

Method used

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  • Test circuit capable of implanting time-domain fluttering and related testing method
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  • Test circuit capable of implanting time-domain fluttering and related testing method

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Embodiment Construction

[0028] see figure 2 . figure 2 A schematic diagram of testing an electronic product 210 to be tested with the first embodiment 220 of the test circuit capable of injecting time domain jitter of the present invention is shown. Such as figure 2 As shown, the present invention couples the signal output from the signal output terminal 212 of the electronic product under test 210 to a low-pass filter 224 included in the test circuit 220 capable of injecting time-domain jitter of the present invention. By using the low-pass filter 224 to change the frequency response characteristics and time-domain response characteristics of the output signal, the test circuit 220 of the present invention that can inject time-domain jitter can properly simulate the insertion loss (insertion loss) caused by the transmission channel of the system. ) and adjust the effective bandwidth, and control the signal-related time domain jitter (data dependent time jitter) gain. By selecting or adjusting ...

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Abstract

A test method being able to inject time domain jitter in includes using analog mode to select proper low pass filter which receives output signal of circuit to be tested for generating a test signal with time domain jitter , then inputting generated test signal to receiving end of circuit to be tested for carrying out required measurement .

Description

technical field [0001] The invention relates to a test circuit and a related test method, in particular to a signal receiving ability test circuit capable of injecting time-domain jitter and a related test method. Background technique [0002] Like all products, electronic products must be tested during the R&D process and after R&D is complete before the product leaves the factory. In various test environments, including a signal receiving ability test, verify whether the signal received by the receiving end of the electronic product can be judged normally. A known electronic product to be tested includes at least one core circuit and a test circuit. The output signal generated by the core circuit is transmitted to a test machine through the output end of the core circuit. The test machine receives and processes the output signal of the core circuit to generate a test signal. The test signal is transmitted to the receiving end of the core circuit. The test circuit compa...

Claims

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Application Information

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IPC IPC(8): H04B17/00H04B17/29
Inventor 徐鑫洲林敏生
Owner VIA TECH INC