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Multilayer processing devices and methods

A technology for processing devices and processing chambers, applied in measuring devices, chemical instruments and methods, chemical/physical processes, etc., can solve problems such as reducing test accuracy

Inactive Publication Date: 2010-06-16
3M INNOVATIVE PROPERTIES CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Variations in the location of this feature can, for example, reduce the accuracy of the test if the location of the processing chamber is not repeatable between different processing devices

Method used

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  • Multilayer processing devices and methods
  • Multilayer processing devices and methods
  • Multilayer processing devices and methods

Examples

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Embodiment Construction

[0026] In the following detailed description of illustrative embodiments, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration several specific embodiments in which the invention may be practiced. It is to be understood that other embodiments may be utilized and structural changes may be made without departing from the scope of the present invention.

[0027]The present invention provides a sample processing device, which can be used to process liquid sample materials (or sample materials carried in the liquid) in a plurality of processing chambers to obtain desired reactions, such as PCR amplification. Multiplication, enzyme chain reaction (LCR), self-sustained sequence replication, studies of enzyme kinetics, homogeneous ligand binding assays, and other chemical, biochemical, or other reactions that may require precise and / or rapid thermal changes, for example. More specifically, the present invention provides ...

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Abstract

Sample processing devices that include transmissive layers and control layers to reduce or eliminate cross-talk between process chambers in the processing device are disclosed. The transmissive layersmay transmit significant portions of signal light and / or interrogation light while the control layers block significant portions of signal light and / or interrogation light. Methods of manufacturing processing devices that include transmissive layers and control layers are also disclosed. The methods may involve continuous forming processes including co-extrusion of materials to form the transmissive layer and control layer in a processing device, followed by formation of the process chambers in the control layer. Alternatively, the methods may involve extrusion of materials for the control layer, followed by formation of process chambers in the control layer.

Description

Background technique [0001] A variety of devices have been designed for the simultaneous processing of chemical, biochemical, and other reactions. Such devices generally include a plurality of wells or processing chambers in which processing takes place. Detection of various analytes or process products can be performed by means of detection of signal light emitted from the process chamber. The signal light can be generated by means of reactions within the processing chamber, for example. In other cases, the signal light may respond to the excitation by means of trigger light (eg, laser, etc.) injected directly into the processing chamber from an external source, wherein the signal light is generated by, for example, chemical light. [0002] Regardless of the mechanism or technique used to generate emitted signal light from a process chamber, detection and comparison of signal light for a particular process chamber may be required. For example, if signal light emitted from ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B01J19/00B01L3/00
CPCB01L2300/0816B01L2300/0864B01L3/502707B01L2300/0812B01L2200/12B01L2300/168B01L3/502715B01L2300/0887Y10S436/809Y10T156/1082Y10T156/1052Y10T156/1002G01N21/0303
Inventor 约耳·R·杜弗雷斯内布莱恩·C·费萨尔特丽萨·J·哥藤布伦特·R·汉森大卫·D·阮
Owner 3M INNOVATIVE PROPERTIES CO
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