IC sorter
A technology of classifiers and buffers, which is applied in the direction of instruments, sorting, and measuring devices, and can solve the problems of increased size, increased time, and large footprint of burn-in classifiers
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[0029] Reference will now be made in detail to the preferred embodiments of the invention, examples of which are illustrated in the accompanying drawings.
[0030] image 3 is a plan view showing an IC sorter according to an embodiment of the present invention. Figure 4 is shown image 3 A plan view of a variant of an embodiment. Since the IC classifier mainly classifies ICs that have passed the burn-in test, the IC classifier is referred to as a burn-in classifier hereinafter.
[0031] Such as image 3 and 4 As shown, the burn-in sorter 100 includes: a board table 143, a tray loader 131, a tray unloader 133, a DC test buffer 121, an unload buffer 123, a sorting unit 151, a DC failure / loading head 161, an insertion / The head 162, and the unloading / sorting head 163 are disassembled.
[0032] The above-mentioned elements: board table 143, tray loader 131, tray unloader 133, DC test buffer 121, unload buffer 123, sorting unit 151 can all be set on the body 110 of the burn-...
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