Memory module testing apparatus and related method

Abstract

A memory module testing apparatus that comprises a test slot adapted to receive a target memory module, wherein the target memory module comprises a first memory unit adapted to store information related to the target memory module, is disclosed. The memory module testing apparatus further comprises a second memory unit adapted to store information related to a memory module, and a first switching unit adapted to selectively provide a driving signal to at least one of the first memory unit and the second memory unit. A memory module testing method for the memory module testing apparatus is also disclosed.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] Embodiments of the invention relate to a memory module testing apparatus. In particular, embodiments of the invention relate to a memory module testing apparatus capable of testing various types of memory modules. [0003] This application claims priority to Korean Patent Application No. 10-2005-0029093, filed on Apr. 7, 2005, the subject matter of which is hereby incorporated by reference in its entirety. [0004] 2. Description of the Related Art [0005] A memory device is a storage device used to temporarily or permanently store data used in a digital logic system. Because the occurrence of a failure in a memory device may cause a fatal error in a system operation in the system in which the memory device is used, manufactured memory devices are tested in a system (e.g., a motherboard) that simulates their actual working environment before being released into the market. [0006] In general, a conventional motherboard us...

AI Technical Summary

Problems solved by technology

Because the occurrence of a failure in a memory device may cause a fatal error in a system operation in the system in which the memory device is used, manufactured memory devices are tested in a system (e.g., a motherboard) that simulates their actual working environment before being released into the market.

However, when a conventional memory module testing apparatus tests a SODIMM, a motherboard using a standard DIMM only supports ×8 1-rank, ×8 2-rank, and ×16 1-rank SODIMM products without supporting ×16 2-rank SODIMM products.

As a result, the conventional memory module testing apparatus cannot test ×16 2-rank SODIMM products.

Images