Memory module testing apparatus and related method

a memory module and testing apparatus technology, applied in the direction of instruments, biological water/sewage treatment, inclination control of settling devices, etc., can solve the problem that the conventional memory module testing apparatus cannot test 16 2-rank sodimm products

Active Publication Date: 2006-10-12
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Because the occurrence of a failure in a memory device may cause a fatal error in a system operation in the system in which the memory device is used, manufactured memory devices are tested in a system (e.g., a motherboard) that simulates their actual working environment before being released into the market.
However,

Method used

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  • Memory module testing apparatus and related method
  • Memory module testing apparatus and related method
  • Memory module testing apparatus and related method

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Embodiment Construction

[0020]FIG. 1 is a perspective view of a memory module testing apparatus in accordance with an exemplary embodiment of the present invention, and FIG. 2 is a block diagram of a memory module testing apparatus in accordance with an exemplary embodiment of the present invention.

[0021] The structure of interface board 200 shown in FIG. 1 is only an exemplary structure for interface board 200. The structure of interface board 200 can take various forms in accordance with the environment in which a target memory module 210 is used, wherein target memory module 210 is the memory module that will be tested using the memory module testing apparatus of FIG. 1. For simplicity, a detailed configuration of interface board 200 is omitted in FIG. 1.

[0022] Referring to FIGS. 1 and 2, a memory module testing apparatus 1 comprises a motherboard 100 and interface board 200.

[0023] Motherboard 100 may take any form that can be used in a device in which target memory module 210 can be mounted, such as...

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Abstract

A memory module testing apparatus that comprises a test slot adapted to receive a target memory module, wherein the target memory module comprises a first memory unit adapted to store information related to the target memory module, is disclosed. The memory module testing apparatus further comprises a second memory unit adapted to store information related to a memory module, and a first switching unit adapted to selectively provide a driving signal to at least one of the first memory unit and the second memory unit. A memory module testing method for the memory module testing apparatus is also disclosed.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] Embodiments of the invention relate to a memory module testing apparatus. In particular, embodiments of the invention relate to a memory module testing apparatus capable of testing various types of memory modules. [0003] This application claims priority to Korean Patent Application No. 10-2005-0029093, filed on Apr. 7, 2005, the subject matter of which is hereby incorporated by reference in its entirety. [0004] 2. Description of the Related Art [0005] A memory device is a storage device used to temporarily or permanently store data used in a digital logic system. Because the occurrence of a failure in a memory device may cause a fatal error in a system operation in the system in which the memory device is used, manufactured memory devices are tested in a system (e.g., a motherboard) that simulates their actual working environment before being released into the market. [0006] In general, a conventional motherboard us...

Claims

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Application Information

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IPC IPC(8): G06F12/00
CPCG11C29/56G11C5/04B01D21/0003B01D21/0015C02F1/28C02F1/52C02F3/327C02F3/34C02F2103/001E01F5/00E03F2201/10
Inventor LEE, JUNG-KUKSEO, SEUNG-JINHAN, YOU-KEUNSHIN, SEUNG-MANAHN, YOUNG-MAN
Owner SAMSUNG ELECTRONICS CO LTD
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