Method of thinning a wafer
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[0009]Please refer to FIGS. 1 to 10. FIGS. 1 to 10 are schematic diagrams illustrating a method of thinning a wafer according to a preferred embodiment of the present invention. As shown in FIG. 1, a wafer 10 is first provided, the wafer including a front surface 12 and a back surface 14. In this preferred embodiment, the wafer 10 is a wafer that already includes the needed semiconductor components or micro-electromechanical components (not shown in the figure) in its front surface 12, and also requires thinning. However, the method of the present invention is not limited by this preferred embodiment, and can be applied to any wafer thinning process in semiconductor processes or in micro-electromechanical processes.
[0010]As shown in FIG. 2, a carrier wafer 20, such as a semiconductor wafer, a glass wafer, a plastic wafer, or a silicon wafer, is subsequently provided, and the front surface 12 of the wafer 10 is bonded to a surface of the carrier wafer 20 with a bonding layer 22. The ...
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