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Heat dissipation device embedded within a microelectronic die

a technology of heat dissipation device and microelectronic die, which is applied in the direction of semiconductor devices, semiconductor/solid-state device details, electrical apparatus, etc., can solve the problems of increasing the average junction temperature increasing the power consumption of the integrated circuit components within the microelectronic dice, and affecting the operation of the microelectronic di

Active Publication Date: 2014-12-04
INTEL CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The present patent is about a heat dissipation device for microelectronic dice, which is designed to improve their cooling efficiency. The device is embedded within the microelectronic die and can be used in thin products like smartphones and tablets. The technical effect of this invention is to prevent damage to the integrated circuits within the microelectronic die caused by high temperatures, which can occur if there is insufficient heat dissipation. The device is designed to improve space utilization and cost-effectiveness, and can be used in various embodiments.

Problems solved by technology

As these goals are achieved, the density of power consumption of integrated circuit components within the microelectronic dice has increased, which, in turn, increases the average junction temperature of the microelectronic die.
If the temperature of the microelectronic die becomes too high, the integrated circuits within the microelectronic die may be damaged or destroyed.
However, when microelectronic dice are used in thin products, such as smart phones, tablets, ultrabook computers, and the like, space for the incorporation of such heat removal solutions is limited.

Method used

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  • Heat dissipation device embedded within a microelectronic die
  • Heat dissipation device embedded within a microelectronic die
  • Heat dissipation device embedded within a microelectronic die

Examples

Experimental program
Comparison scheme
Effect test

example 7

[0037]In Example 7, the subject matter of any of Examples 1 to 4 can optionally include the microelectronic die active surface electrically connected to a microelectronic substrate.

[0038]In Example 8, the subject matter of any of Examples 1 to 4 can optionally include an integrated heat spreader in thermal contact with the at least one heat dissipation device.

[0039]In Example 9, the subject matter of any of Examples 1 to 4 can optionally include at least one of a seed layer and a barrier layer disposed between the microelectronic die and the at least one heat dissipation device.

[0040]The following examples pertain to further embodiments, wherein Example 10 is a method of fabricating a heat dissipation device within a microelectronic die, comprising forming a microelectronic die having an active surface and an opposing back surface; forming at least one trench extending into the microelectronic die from the microelectronic die back surface; and disposing at least one layer of thermal...

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Abstract

The subject matter of the present application relates to a heat dissipation device that is embedded within a microelectronic die. The heat dissipation device may be fabricated by forming at least one trench extending into the microelectronic die from a microelectronic die back surface, which opposes an active surface thereof, and filling the trenches with at least one layer of thermally conductive material. In one embodiment, the heat dissipation device may be a thermoelectric cooling device.

Description

TECHNICAL FIELD[0001]Embodiments of the present description generally relate to the field of heat dissipation from a microelectronic die, and, more specifically, to a heat dissipation device embedded within the microelectronic die.BACKGROUND ART[0002]The microelectronic industry is continually striving to produce ever faster and smaller microelectronic dice for use in various mobile electronic products, such as portable computers, electronic tablets, cellular phones, digital cameras, and the like. As these goals are achieved, the density of power consumption of integrated circuit components within the microelectronic dice has increased, which, in turn, increases the average junction temperature of the microelectronic die. If the temperature of the microelectronic die becomes too high, the integrated circuits within the microelectronic die may be damaged or destroyed. In typical microelectronic dice, such as flip-chip type dice, heat is generally removed convectively with a heat spre...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L23/34
CPCH01L23/34H01L23/3677H01L23/38H01L23/42H01L23/562H01L24/16H01L24/32H01L24/73H01L29/0657H01L2224/0401H01L2224/16225H01L2224/32225H01L2224/32245H01L2224/73204H01L2224/73253H01L2924/10253H01L2924/10271H01L2924/1032H01L2924/1432H01L2924/1433H01L2924/1434H01L2924/16251H01L2924/3511H01L2924/10155H01L2924/12042H01L2924/10158H10N19/00H01L2924/00
Inventor KONCHADY, MANOHAR SROY, MIHIR K.
Owner INTEL CORP