Low gate current junction field effect transistor device architecture

a transistor and junction field technology, applied in the direction of semiconductor devices, basic electric elements, electrical equipment, etc., can solve the problem of depletion of the top ga
US20190131404A1Pending Publication Date: 2019-05-02ANALOG DEVICES INT UNLTD

Patent Information

Authority / Receiving Office
US · United States
Patent Type
Applications(United States)
Current Assignee / Owner
ANALOG DEVICES INT UNLTD
Publication Date
2019-05-02

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Abstract

A JFET is provided with a very low gate current. In tests the excess gate current above the theoretical minimum current for a similarly sized reverse biased p-n junction was not observed. The JFET includes a lightly doped top gate and doped regions beneath the drain of the JFET.
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Description

FIELD OF DISCLOSURE

[0001] The present disclosure relates to an improved architecture for junction field effect transistors, JFETs, which reduces excess gate current of a JFET, such that the gate current substantially matches the reverse bias diode current that would be expected from the reverse current flow of a reverse biased p-n junction.BACKGROUND

[0002] Broadly speaking field effect transistors, FETs, modulate the width of a “channel” region of semiconductor in order to vary the magnitude of current flowing between current flow terminals of the device. These terminals are known as a drain and a source of the FET.

[0003] The current is modulated by subjecting the channel region to an electric field which can alter the size of depletion regions with the FET. The electric field is generated by applying a voltage to a “gate” of the FET. The gate region is insulated from the channel. The way in which the isolation is achieved can be used to classify FETs.

[0004] In one class of FET, the gat...

Claims

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