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Microscope system

a microscope and system technology, applied in the field of microscope systems, can solve the problems of limited adjustment of the distribution of illumination light, difficult to observe the image of objects, and difficult to freely select the shape and observe the obj

Active Publication Date: 2016-02-16
NIKON CORP
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

Enables flexible adjustment of light distribution for improved specimen observation, allowing for optimal image conditions by calculating and adjusting the amplitude transmittance distribution in real-time.

Problems solved by technology

However, in the above-mentioned microscopes, the shape of the phase ring is fixed to some extent, and there is a limitation in adjustment of the distribution of the illumination light.
Furthermore, even in a case of selecting the shape of the phase ring, the selection is performed on the basis of determination or experience of the observer, and thus the shape of the phase ring is not always formed to be able to observe the image of the object at its best condition during observation.
Therefore, in the phase-contrast microscopes, it is difficult to freely select the shape and observe the image of the object at its best condition during the observation.

Method used

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Examples

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first example

[0023]As a first example, a description will be given of a microscope system 100 which is automatically adjusted by deriving an intensity distribution of an illumination light and an amplitude transmittance distribution of a light. Especially, the microscope system 100 is suitable for the phase object which is such as water-clear cells that does not change intensity of the light and only changes the phase especially in a transmitted light.

[0024]100>

[0025]FIG. 1 is a schematic configuration diagram of the microscope system 100. The microscope system 100 includes a microscope that mainly includes: an illumination light source 30; an illumination optical system 40; a stage 50; an imaging optical system 70 and an image sensor 80. Furthermore, the microscope system 100 includes a calculation section 20 such as a computer. Hereinafter, the center axis of rays emitted from the illumination light source 30 is set as the Z axis direction, and the directions, which are perpendicular to the Z ...

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Abstract

A phase-contrast microscope system includes: an illumination optical system that illuminates a specimen with an illumination light from a light source; an imaging optical system that forms an image of the specimen from a light from the specimen; a first spatial modulation element that is disposed in a position of a pupil of the imaging optical system and changes an amplitude transmittance distribution of the light from the specimen; an image sensor that detects the image of the specimen by the imaging optical system and outputs a picture signal; a calculation section that calculates the amplitude transmittance distribution of the light from the specimen appropriate for observing the specimen on the basis of the output data detected by the image sensor and the amplitude transmittance distribution of the light from the specimen formed by the first spatial modulation element.

Description

CROSS-REFERENCE TO RELATED APPLICATION[0001]This application is a non-provisional application claiming priority to and the benefit of U.S. Provisional Application No. 61 / 534,155, filed Sep. 13, 2011. In addition, priority is claimed on Japanese Patent Application No. 2011-111032, filed on May 18, 2011. The entire contents of which are incorporated herein by reference.BACKGROUND[0002]1. Field of the Invention[0003]The present invention relates to a microscope system that derives and forms distribution of illumination light appropriate for observation by using phase-contrast.[0004]2. Description of Related Art[0005]In phase-contrast microscopes, a ring diaphragm and a phase ring form the intensity distribution of the illumination light.[0006]Since the distribution of the illumination light has a great effect on an observational image of a specimen such as the phase ring have been subjected to tests to further improve the observation picture of the specimen. For example, in Japanese Un...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): H04N7/18H04N9/47G02B21/14G02B21/36
CPCG02B21/14G02B21/365G02B21/367
Inventor FUKUTAKE, NAOKIYAZAWA, HIROKINAKAYAMA, SHIGERUNAKAJIMA, SHINICHI
Owner NIKON CORP