Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Compound whole-working order testing device control and protection system, and failure protection scheme

A technology of control and protection and test device, applied in overload protection device, single semiconductor device testing and other directions, to achieve the effect of clear design hierarchy, easy coordination of control and protection functions, and clear function division

Active Publication Date: 2008-06-04
CHINA ELECTRIC POWER RES INST +1
View PDF3 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem of coordination, control and fault protection of each sub-equipment of the synthetic full working condition test device, the purpose of the present invention is to provide a control and protection system and a fault protection method of the synthetic full working condition test device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Compound whole-working order testing device control and protection system, and failure protection scheme
  • Compound whole-working order testing device control and protection system, and failure protection scheme

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] Attached below figure 1 The present invention is further described.

[0041] The circuit part of the synthetic full working condition test device mainly includes three parts: the low-voltage charging circuit, the synthetic full working condition test circuit and the low voltage high current source. The auxiliary equipment mainly includes two sets of water cooling devices. The first water cooling device is used for auxiliary The valve is supplied with water, and the second water cooling device is used to supply water to the test valve alone. Therefore, the underlying control and protection subsystem of the control and protection system of the synthetic full-working condition test device mainly includes the following five independent control and protection subsystems:

[0042] ●Charging circuit control and protection subsystem

[0043] Synthetic full working condition test circuit control and protection subsystem

[0044] ●Low-voltage and high-current source control an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The system comprises: an upper layer control and protection system, a measurement system for the tester, an operation platform, a wave recorder, and a bottom control and protection subsystem, which comprises mainly: a control and protection subsystem for low-voltage charge loop, a control and protection subsystem for synthesis full-condition test circuit, a control and protection subsystem for low-voltage large-current power, a control and protection subsystem for the first water cooling device to supply water for a thyristor in tester, and a control and protection subsystem for the second water cooling device to supply water singly for the sample valve. According to different faults, it designs eight-level protection measures for the control and protection system, and sets nine-level PRI as fault seriousness.

Description

technical field [0001] The invention relates to the technology for performing operation test on a thyristor valve in a power system and a power electronic system, in particular to a control and protection system and a fault protection method for a synthetic full-working-condition test device. Background technique [0002] With the gradual promotion of the application of power electronics technology in power systems, high-voltage valves based on thyristor series voltage equalization technology have become the core components of various high-power power electronic devices. For example, Static Var Compensator (SVC), Thyristor Controlled Series Compensator (TCSC), High Voltage Direct Current Transmission (HVDC), etc. The operation test is an important test method related to improving the design and manufacturing level of various high-voltage series thyristor valves and improving their reliability. At present, the synthesis test method is generally used in the world to carry out...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R1/36
Inventor 邱宇峰温家良徐桂芝查鲲鹏
Owner CHINA ELECTRIC POWER RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com