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Detecting apparatus of display panel

A technology for inspection devices and displays, applied to measuring devices, parts of TV systems, parts of electrical measuring instruments, etc., can solve problems such as damage to the probe itself, failure to display the panel inspection, poor electrical connection, etc., to prevent damage effect

Active Publication Date: 2008-12-03
NIHON MICRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In such an inspection device, the electrical connection state between the probe and the electrodes of the display panel is greatly affected by the dust adhering to the electrodes of the display panel, which may cause poor electrical connection, and the display panel cannot be correctly inspected. an examination
[0004] Especially when there is a large foreign matter attached to the electrode, when the probe is pressed against the electrode, the probe itself will be damaged because the probe is pressed while in contact with the large foreign matter. In addition, other parts of the detection unit using the probe Components are pressed against large foreign objects, which can damage other components

Method used

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  • Detecting apparatus of display panel
  • Detecting apparatus of display panel
  • Detecting apparatus of display panel

Examples

Experimental program
Comparison scheme
Effect test

no. 1 Embodiment

[0027] Referring to FIGS. 1 to 4 , the inspection device 10 is applied to a visual lighting inspection using a rectangular liquid crystal display panel as a display panel 12 to be inspected. The inspection device 10 is manufactured so that the operator can inspect with the naked eye in a state in which the panel 12 is arranged obliquely.

[0028] In the following description, the direction of the long edge of the panel 12 is referred to as the X direction (first direction), the direction of the short edge of the panel 12 is referred to as the Y direction (second direction), and the direction perpendicular to the panel 12 is referred to as the X direction (first direction). is the Z direction (third direction). In addition, the axes extending in the X, Y, and Z directions are referred to as the X axis, the Y axis, and the Z axis, respectively. In addition, the direction in which the operator visually sees the side of the panel 12 that is lit is referred to as the front, and th...

no. 2 Embodiment

[0111] In the above-mentioned embodiment, the cleaning device 40, the cleaning device 42, the foreign object sensor 140, and the foreign object sensor 142 are set as two groups respectively. Instead, only one group can be set to clean the electrodes 14 and 16 of the panel 12 and clean the foreign objects. examine.

[0112] refer to Image 6 In the cleaning unit 160, the θ stage 162 is supported by the Z stage 80 (not shown) instead of the cleaning device 42 and the foreign object sensor 142, and the panel support portion 82 is supported by the θ stage 162 to form a pre-calibration The apparatus 38, the theta stage 162 rotates the panel support 82 by at least 90 degrees about the θ axis extending in the Z direction.

[0113] The cleaning unit 160 performs cleaning and inspection of the electrodes 14 and 16 of the panel 12 as follows.

[0114] First, either one of the electrode 14 and the electrode 16 is cleaned by the cleaning device 40 , and an image is taken by the foreign ...

no. 3 Embodiment

[0119] The present invention is also not limited to such a device, that is, each panel 12 is supported obliquely by the chuck top 74 and the panel support part 82, the panel 12 is transported in an inclined state, and the panel 12 is transported in an inclined state. 12 Devices for cleaning, foreign matter inspection and lighting inspection.

[0120] The present invention can also be applied to other types of inspection devices such as the following devices, for example, each panel 12 is supported upward by the chuck top 74 and the panel support portion 82, transported in this state, and cleaned and inspected for foreign objects in this state And the device for lighting inspection; each panel 12 is supported upward by the panel support part 82, and the cleaning and foreign matter inspection are performed in this state, and then it is turned to an inclined state and sent to the conveying device, and the lighting inspection is performed in an inclined state inspection device.

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PUM

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Abstract

To provide an inspection system of a display panel for preventing probes and probe units from damages caused by dust adhered to electrodes of the display panel. This inspection system is used for the inspection of the rectangular display panel, which has a plurality of electrodes formed inside a plane in parallel to this panel by spacing in one direction. The system comprises a configuration area formation device to form configuration area, where the display panel is located, and a debris detector which detects any foreign material adhered to the electrodes of the display panel, arranged on the configuration area to output foreign material signal, if there is a foreign material.

Description

technical field [0001] The present invention relates to an inspection device for a display panel having a plurality of electrodes arranged in at least one row, such as a liquid crystal display panel. Background technique [0002] A device for inspecting a display panel having a plurality of electrodes arranged in at least one row, such as a liquid crystal display panel, generally has a structure in which a plurality of contacts, namely probes, which are respectively in contact with the electrodes of the display panel, are assembled on a substrate. A detection unit is formed on the seat, and the detection unit is assembled on the frame of the device, and the display panel is placed on the inspection table arranged in the frame, and the inspection table moves the display panel to X, Y, and Z directions. This push displays the electrodes and probes on the panel. (Refer to Japanese Patent Laid-Open No. 1044738 and Japanese Patent Laid-Open No. 7454677) [0003] In such an insp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/02G01R31/00G01R31/26H01L21/66
CPCG01N21/88G01N21/94G02F1/1309G01N2021/9513H04N25/701
Inventor 安斋正行
Owner NIHON MICRONICS