Automated test method and apparatus for quick positioning question

Abstract

The invention discloses a method of automation test of quick locating problem, which comprises the following steps: calling relative checking case; operating the checking case in the testing device; checking the device fail; basing on the testing case; checking present relative parameter value and state value in the testing device; researching the checking problem of the parameter value and the state value. This invention also discloses a device of automation test of quick locating problem, which can improve executive efficiency in the automation test.

Description

Technical field [0001] The invention relates to an automated test system, in particular to an automated test method and equipment for quickly locating problems. Background technique [0002] During product testing, certain basic business functions and processes usually need to be tested in each version of the product, and an automated testing system can be used for these repeated testing tasks. An important content in automated testing is the writing and maintenance of Action Word (AW). AW is a command line script that realizes a function, which "encapsulates" the operation commands and functions of the tested product. It is a component element of the test logic. Numerous AWs form a reusable function library. A series of combinations of AWs executed in a specific order can form test logic. [0003] During the execution of automated testing, test report analysis is an important content, through which test reports can be analyzed and the problem can be determined. However, the exis...

AI Technical Summary

Problems solved by technology

However, the existing reports often provide insufficient information, especially when the test case fails the test, that is, the test case does not pass (Not Good, NG), and the information recorded during the test (such as the configuration, status and The configuration of peripheral equipment) is not rich enough, so the analysis of the test report cannot be carried out well, and the problems in the test cannot be accurately determined during the test

[0004] In the existing technical solution, when NG occurs in the test step, a unified processing module is called to detect all configuration parameters in the device under test and the current main state parameters of the device under test, and pass these parameter values ​​of the device under test and status values ​​can locate problems in the test, but there are many parameter values ​​and status values ​​that require parameters during the entire test process, so the query time is relatively long, and the complexity of different tested products is different, and the query time is also different , which will affect the efficiency of automated execution

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