Tester for maintainability of electron device
An electronic equipment and maintainability technology, which is applied in the field of maintainability testing instruments, can solve problems such as failure to provide samples of external circuit failures, failure to simulate aging or damage of circuit board components, and inconsistencies in fault diagnosis time, etc.
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Embodiment 1
[0015] Embodiment 1: see attached figure 1 , 2, a maintainability tester for electronic equipment, comprising: a fault setting circuit 2, an interface circuit 1, a timer 3, and a power supply circuit 5;
[0016] The fault setting circuit 2 includes a plurality of relays J1-J5, a plurality of manual switches K1-K5 respectively controlling these relays J1-J5, a plurality of manual line selection switch groups K10-K13, and a group of manual line selection contacts B;
[0017] The interface circuit 1 includes one or more pairs of multi-core input interfaces and output interfaces C1, C1', C2, C2' of the same core number, and each pair of multi-core input interfaces and output interfaces C1, C1 of the same core number ', the core wires of C2 and C2' have the same definition, and part of the core wires are 1, 7, 13, 19, 25 between the key fault lines C1 and C1'; 26-30 between C2 and C2'. The normally closed contacts J1 / 1, 2, 3, 4 of relays J1~J5;...; 8~12, 14~18, 20~24 are connecte...
Embodiment 2
[0021] Embodiment 2: see attached figure 1 , 2. In the electronic equipment maintainability tester described in embodiment 1, it can also include a fault display circuit 4, which is composed of 5 normally open contacts J1 / 5, 6 respectively affected by the plurality of relays J1~J5 ;...; J5 / 5, 6 are composed of indicator lights D1~D5; when a manual switch K1~K5 is turned on and the corresponding relay J1~J5 is activated, the corresponding indicator lights up, indicating a certain fault setting.
Embodiment 3
[0022] Embodiment 3: In the electronic device maintainability tester described in Embodiment 1 or 2, the timer 3 has a timing capacity of 999999 seconds, and the maximum recording time can be manually set. In this way, the unqualified value of the maintainability index can be set in the test according to the maintainability index requirement.
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