Quick phase demodulation method based on fringes perturbation

A technology for solving phases and fringes, which is applied in image data processing, measuring devices, instruments, etc., and can solve problems such as the influence of measurement speed

Inactive Publication Date: 2009-05-13
海安江理工技术转移中心有限公司 +1
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

This type of method has a good effect on dephasing complex surfaces, but it needs to increase the number of projected gratings beyond the basic phase-shifting grating stripes, and the measurement speed is affected

Method used

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  • Quick phase demodulation method based on fringes perturbation
  • Quick phase demodulation method based on fringes perturbation
  • Quick phase demodulation method based on fringes perturbation

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Embodiment Construction

[0033] Below with reference to accompanying drawing, specific embodiment of the present invention is described in more detail:

[0034] see figure 1 , Raster projection system: including a computer, a camera connected to the computer through a graphics card, and a projection device controlled by the computer.

[0035] see figure 2 , from top to bottom in the figure is the grating fringe pattern I 1 , I 2 , I 3 and I 4 , The dotted line is perturbed part. figure 2 The horizontal axis of each figure in the figure represents the phase θ(x, y), the vertical axis represents the gray scale of the grating image, and the grating parameters are set to I'(x, y)=1, I"(x, y)=1.

[0036] Specific steps are as follows:

[0037] When solving the phase, first obtain the perturbation function from the grating image, use the perturbation function to solve the main value of the phase, and then use the perturbation function to determine the order of the grating stripes to obtain the ...

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PUM

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Abstract

The invention discloses a rapid phase unwrapping method based on fringe perturbation and comprises the follows: firstly, the raster image added with fringe perturbation is acquired; secondly, a perturbation degree function can be solved from the fringe image and the phase principal value can be unwrapped according to the fringe perturbation condition described by the perturbation degree function; by traversing the fringe image, the fringe period number of the perturbation part and the rest can be acquired and a complete phase value can be unwrapped according to the relations between the perturbation degree function and the jumping of the fringe period number as well as the phase principal value. Compared with the prior art, the phase-shifting raster of the invention comprises the perturbation fringe, moreover, the invention can unwrap the complete phase value by processing four phase shift pictures and reduce the amount of the projection raster required by phase unwrapping as well as improve the measuring speed; the perturbation condition is described through the perturbation degree function and the phase principal value can be solved so that the acquirement of the phase principal value has higher accuracy; the fringe period number is determined through the perturbation degree function and then the complete phase value can be solved.

Description

technical field [0001] The invention relates to a fast phase solution method in a grating projection method three-dimensional measurement system, in particular to a fast phase solution method based on fringe perturbation. Background technique [0002] The optical three-dimensional object profile measurement technology obtains the three-dimensional information of the surface shape of the measured object by analyzing the image of the object. Among them, the phase profile measurement technology based on grating projection is not sensitive to the change of the surface reflectance of the object, has high measurement accuracy, and is easy to realize automatic measurement. It is a relatively representative three-dimensional measurement method. The measurement principle of the phase method is: a grating light field modulated by a periodic function is projected on the surface of the measured object. Due to the change of the surface height of the object, the phase of the grating strip...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24G06T7/00
Inventor 达飞鹏盖绍彦
Owner 海安江理工技术转移中心有限公司
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