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Digital image processing method and apparatus for CMOS imaging sensor

An oxide semiconductor and image sensor technology, which is applied in image communication, color TV parts, TV system parts, etc., can solve the problem of low image contrast, improve contrast, improve dynamic response range, and ensure quality Effect

Inactive Publication Date: 2009-07-01
VIMICRO CORP
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  • Summary
  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

In view of this, an embodiment of the present invention provides a digital image processing method of a CMOS image sensor to solve the problem of low image contrast caused by the existing digital image processing method of a CMOS image sensor

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  • Digital image processing method and apparatus for CMOS imaging sensor
  • Digital image processing method and apparatus for CMOS imaging sensor

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Abstract

The invention discloses a method and device used to process the digital images of a semiconductor image sensor for complementary metal oxide with the purpose of solving the low image contrast problem caused by present method of processing the digital images in a CMOS image sensor. The method sets the exposure time into multiple exposure times according to the preinstalled exposure time and then exposes the part of the preinstalled pixels in a pixel array according to the set exposure time; when a exposure time is reached, the camera records the exposure details of the part of the preinstalled pixel points and then carries on the digital signal processing (DSP) of the part of the preinstalled pixel points. With the technical proposal, the invention has the advantages that the dynamic response range of the CMOS image sensor can be enlarged, thus improving the image contrast and quality.

Description

technical field The invention relates to the technical field of digital image processing, in particular to a digital image processing method and device of a complementary metal oxide semiconductor image sensor. Background technique CMOS (Complementary Metal-Oxide-Semiconductor, Complementary Metal-Oxide Semiconductor) image sensor has the characteristics of high integration, common manufacturing process, small size, low power consumption, and no halo. In terms of non-contact non-destructive measurement and target monitoring, etc., Like the relatively mature CCD (Charge Coupled Device, Charge Coupled Device) system, it is playing an increasingly important role. The human eye is very sensitive to changes in light and shade in the external environment. In a strong light environment, the pupil narrows to make the scene less dazzling; while in weak light, the pupil dilates to make the scene as clear as possible. In imaging, this is called exposure. When the external light is w...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/335H04N25/00
Inventor 谢律
Owner VIMICRO CORP