Method and machine for repetitive testing of an electrical component

Abstract

A method (1000,1100,1200,1300,1400) automatically tests a parameter of an electronic component (12,120) to determine whether the component (12,120) has an acceptable value. The method (1000,1100,1200,1300,1400) employs an automatic electronic component testing machine (2) having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method (1000,1100,1200,1300,1400) places the component (12,120) in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method (1000,1100,1200,1300,1400) also places the component (12,120) in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method (1000,1100,1200,1300,1400) rejects the component (12,120) only if all measured values are unacceptable, whereby the probability of falsely rejecting the component (12,120) is less than if only a single measuring step were performed.

Description

[0001] related application [0002] This application claims the benefit of priority to U.S. Provisional Patent Application Serial No. 60 / 630,261, filed November 22, 2004, entitled "Method for Repetitive Testing of an Electrical Component" , which is incorporated herein by reference in its entirety. U.S. Provisional Patent Application Serial No. 60 / 630,253, entitled "Vacuum Ring Designs for Electrical Contacting Improvement," filed November 22, 2004, is also incorporated by reference in its entirety in this manual. technical field [0003] The present disclosure relates generally to testing of electronic components, and more particularly to testing of capacitors. Background technique [0004] Capacitors, which store electrical charge, are one of the basic building blocks of electronic circuits. In its most basic form, a capacitor consists of two conductive surfaces separated by a small distance from each other, with a non-conductive dielectric material positioned between t...

AI Technical Summary

Problems solved by technology

[0017] The challenge for capacitor test equipment is to reliably make each measurement without introducing errors, as erroneous pass / reject decisions can slow down production, reduce test throughput, or both by retesting rejected components Have

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