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Image signal sampling circuit and its method

A technology of image signal and sampling circuit, which is applied in image communication, television, electrical components, etc., can solve problems such as difficulty in low-light image acquisition, and achieve the effect of circuit structure optimization and cost saving

Active Publication Date: 2008-06-11
BYD SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem solved by the present invention is to propose an image signal sampling circuit and its method that can increase the gain of the image signal during sub-sampling, which overcomes the technical problem that the image sensor is difficult to collect low-light images

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Embodiment Construction

[0021] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0022] Such as figure 1 In the 1 / X sub-sampling circuit shown, the control unit (not shown in the figure) controls three switch groups: the source-side column switch group, the ground-side column switch group and the inter-column switch group, so that the circuit works in the normal working mode and Sampling mode of operation. Among them, S0, S1, S2, ... are source-side column switches; K0, K1, K2, ... are ground-side column switches; K01, K12, K23, K34, K45, ... are inter-column switches. Each sampling column circuit is provided with a source terminal column switch and a ground terminal column switch respectively, and inter-column switches are provided between adjacent sampling columns. The above switch and control unit constitute the working mode control circuit of the present invention. The signal acquisition unit is composed of capacitors C0, C...

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Abstract

The invention discloses an image signal sampling circuit and the method thereof. The circuit comprises signal collection units, a column read unit and an operation mode control circuit. The control circuit comprises a control unit, a source column switch block, a ground column switch block and an inter-column switch block; each sampling column circuit is respectively provided with a source column switch and a ground column switch, the source column switch is connected between the signal source and the input ends of the signal collection units, the ground column switch is connected between the ground and the bottoms of the signal collection units; the input end of the column read unit is connected with the input ends of the signal collection units, the output end of the column read unit is used to output sampling signals; an inter-column switch is arranged between the input ends of the prior column signal collection units and the bottoms of the next column signal collection units; the control unit is used to control the cut-off or closing operation of the switch blocks according to the sampling operation mode. The invention can realize the signal gain of the image sensor, has the circuit structure more optimized and the chip area with small increase, and saves the cost.

Description

technical field [0001] The invention relates to a sampling control circuit in an image sensor, in particular to a sub-sampling circuit capable of increasing image signal gain and a method thereof. Background technique [0002] Today, with the rapid development of CMOS image sensors, the processing speed of image signals seriously restricts the development of high-pixel image sensors, and the processing speed of image signals and the gain of image signals are mutually restrictive. To increase the speed, the gain should not be too high. High, but insufficient gain will make it difficult for the image sensor to capture low-light images. Therefore, on the premise of not affecting the speed, increasing the gain as much as possible has become the focus of competition among CMOS image sensor design manufacturers. [0003] The CMOS image sensor in the prior art generally does not perform processing when sampling the image signal, that is, the image signal is directly sampled to the...

Claims

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Application Information

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IPC IPC(8): H04N3/15H04N5/335
CPCH04N3/1575H04N5/335H04N25/00H04N25/75
Inventor 冯卫胡文阁付璟军赵辉刘芳
Owner BYD SEMICON CO LTD