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Rapid spectrometer and its measurement method

A measurement method and spectrometer technology, applied in the field of optical measurement, can solve the problems of low relative spectral sensitivity and the inability of the probe to meet high precision at the same time, and achieve the effects of large dynamic range, good linearity and accurate results

Active Publication Date: 2008-10-22
HANGZHOU EVERFINE PHOTO E INFO
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  • Description
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AI Technical Summary

Problems solved by technology

Solve the technical problem that the probes in the prior art cannot meet the matching requirements of high precision and low relative spectral sensitivity at the same time

Method used

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  • Rapid spectrometer and its measurement method
  • Rapid spectrometer and its measurement method
  • Rapid spectrometer and its measurement method

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Embodiment

[0028] Such as figure 1 As shown, the fast spectrometer includes a fast spectral analysis system 1 for measuring the spectral power distribution of the light source to be measured, and is connected to the fast spectral analysis system 1 for collecting optical signals and transmitting them to the fast spectral analysis system 1. The signal acquisition device 2, the fast spectrum analysis system 1 and the microcontroller 3 are electrically connected. It also includes a reference probe 4 for measuring the luminosity of the light source to be measured, and the reference probe 4 is electrically connected to the above-mentioned microcontroller 3 through a signal conversion circuit 5 for converting the analog electrical signal of the reference probe 4 into a digital signal. connect. The microcontroller 3 is electrically connected with the computer 6 and can exchange data with it. The computer 6 can combine the light quantity of the light source to be measured measured by the refere...

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Abstract

The invention relates to a rapid spectrograph and a measuring method thereof. The rapid spectrograph comprises a rapid spectrum analyzing system for measuring the spectrum power distribution of a light source to be measured; an optical signal acquisition device for acquiring and transmitting an optical signal to the rapid spectrum analyzing system is connected with the rapid spectrum analyzing system; and the rapid spectrum analyzing system and a microcontroller are in electric connection. The invention is characterized by also comprising a reference probe for measuring the photometric quantity or the radiation measurement of the light source to be measured; and the reference probe and the microcontroller are in electric connection by a signal converting circuit which can convert an analog signal into a digital signal. The rapid spectrograph and the measuring method utilize the reference probe to realize the linear measurement of the photometric quantity or the radiation measurement in a large-span dynamic range and correct a measuring result of the probe to an exact value by utilizing the measuring result of optical spectroscopy. Various known standard values are stored in a computer for transferring in correction to correct a measured value; therefore, the measuring precision can be effectively improved.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to a fast spectrometer and a measurement method thereof. Background technique [0002] Compared with the traditional scanning spectrometer, the fast spectrometer has the advantage of fast measurement speed, and it only takes a few milliseconds to complete a measurement. The fast spectrometer uses an array detector such as a charge-coupled device (CCD) or a photodiode array (PDA) as its photoelectric sensing device. Many pixels on the array detector can separate the light within a certain wavelength range from the splitting element. All monochromatic light is sensed and converted into electrical signals at one time, and the magnitude of the signal is proportional to the intensity of the monochromatic light irradiated on the pixel. After the fast spectrometer is calibrated by a standard light source with known spectral power distribution, it can realize the rapid measurem...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/30
Inventor 潘建根沈海平丁鹏飞
Owner HANGZHOU EVERFINE PHOTO E INFO
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