Multifunctional test device based on SCM system
A multi-functional test and single-chip microcomputer technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of low test efficiency and long time, so as to improve test efficiency and accuracy, improve work efficiency, and increase test speed Effect
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[0016] The present invention will be further described below in conjunction with drawings and embodiments.
[0017] Such as figure 1 The multi-function test device based on the single-chip microcomputer system shown includes a switching power supply, a test control board and a front-end control panel. The test control board includes an oscillator and a single-chip microprocessor (MCU), and the oscillator is connected with the microcontroller. The model of the single-chip microprocessor is STC89C52. The front control panel includes a vacuum fluorescent display (VFD screen) and an interface, and the interface between the single-chip microprocessor and the front control panel is connected through a high-speed synchronous serial port control bus (SPI control bus) and a power line. The switching power supply is connected with the test control board.
[0018] Instructions for use of this multi-function test device based on single-chip microcomputer system:
[0019] Since there a...
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