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Analog wire laying method facing to integrated circuit digital-analog mixing test adapter

A technology of test adapters and digital-analog mixing, which is applied in the parts of electrical measuring instruments, measuring leads/probes, and improvement of basic electrical components. It can solve problems such as mutual interference of analog signals and achieve the effect of high-speed signal transmission.

Inactive Publication Date: 2009-04-22
BEIJING CHIPADVANCED
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Problems solved by technology

However, the integrated circuit parallel test adapter still has certain deficiencies in overcoming the problem of mutual interference of analog signals in the high-speed parallel test process

Method used

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  • Analog wire laying method facing to integrated circuit digital-analog mixing test adapter
  • Analog wire laying method facing to integrated circuit digital-analog mixing test adapter
  • Analog wire laying method facing to integrated circuit digital-analog mixing test adapter

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Embodiment Construction

[0022] The invention is proposed based on the actual requirement of developing a high-speed multi-pipe-core parallel test digital-analog hybrid circuit test adapter. In the process of developing the integrated circuit high-speed parallel digital-analog hybrid test adapter, the inventor faced the problem of high operating frequency of the test adapter and serious mutual interference of analog signals, and adopted a differential routing method to arrange analog transmission signal resources.

[0023] To put it simply, the differential signal means that the driving end sends two equal and inverted signals, and the receiving end judges the logic state "0" or "1" by comparing the difference between the two voltages. Compared with ordinary single-ended signal traces, the advantages of differential signals are mainly reflected in the following three aspects:

[0024] a. Strong anti-interference ability. Because the coupling between the two differential lines is very good, when there...

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Abstract

The invention provides an analog wiring method which is faced to a digital-analog mixed test adapter of an integrated circuit. The method utilizes the differential routing mode to arrange analog transmission signal resources and carries out the wiring based on the principle of uniform packet, thereby being capable of effectively solving the technical problem that analog signals in the high-speed parallel test are mutually interfered and isolated, being beneficial to realizing the signal high-speed transmission in the test process of the integrated circuit, realizing the parallel test technology without the mutual interference on the basis and providing a powerful technical support for the further development of the test industry of the integrated circuits.

Description

technical field [0001] The invention relates to an analog wiring method for solving the signal interference problem in the integrated circuit test process, in particular to an integrated circuit high-speed parallel digital-analog hybrid test adapter implementation, which can effectively solve the differential routing of analog signal mutual interference in the high-speed parallel test process. A wire method belongs to the technical field of integrated circuit testing. Background technique [0002] With the advancement of integrated circuit manufacturing technology, people have been able to manufacture integrated circuits with complex circuit structures and high integration. However, these integrated circuits are only connected to external circuits through a limited number of pins, which brings many difficulties to judge whether the integrated circuits are good or bad. In view of this situation, people generally use integrated circuit testers to detect the quality of integra...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/02G01R1/06G01R1/18G01R1/20G01R31/3167
Inventor 刘炜石志刚吉国凡张琳王慧孙博金兰赵智昊李尔孙杨
Owner BEIJING CHIPADVANCED
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