Test device of digital communication error rate

Abstract

The present invention relates to a device for testing digital communication bit error rate, comprising a communication interface module for connecting to external computers or controllers; a bit error processing module for analyzing bit error of a device or system to be tested, and transmitting result to an external computer or controller; a clock generating module for selecting operation clock according to instruction of the communication interface module, and supplying the operation clock to the bit error processing module; an opto-electrical/electro-optical converter module for converting optical signal from outside into electric signal and transmitting the same to the bit error processing module, and converting high-speed electric signal generated with the bit error module into optical signal to output; a software system module for controlling the integral testing device. The device, including a bit error testing function for electric interface and optical interface, can be used as independent testing apparatus, also can be remote controlled or integrated onto an automatic testing system.

Description

technical field [0001] The invention relates to a test device for a bit error rate of digital communication, which belongs to the technical field of communication. Background technique [0002] With the increasing application of high-quality digital video and audio transmission, especially the rapid development of broadband IP services such as interactive network television (IPTV) and video calls in recent years, users' demand for optical transmission network bandwidth is also increasing. bigger. A modern transmission network system is composed of many different types of devices and transmission links, including communication devices that connect the network with other network elements through communication links. In order to support high-speed communication systems, it is necessary to develop high-speed communication devices and subsystems. In order to ensure quality, such devices and subsystems must pass a large number of strict assessment tests before leaving the factor...

AI Technical Summary

Problems solved by technology

The complex processing process of the bit error tester makes it the most expensive single test equipment in the production of high-speed communication devices, and when the signal rate is higher, its price is also more expensive, and the investment cost of purchasing such test equipment has become a part of the device. The burden of production and subsystems poses a great obstacle to large-scale deployment of high-speed communication systems

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