X-ray fluorescent analysis apparatus

A fluorescence analysis and X-ray technology, applied in the field of X-ray fluorescence analysis, can solve problems such as corrosion of electronic components, large scattering background, difficult maintenance and maintenance, etc., and achieve protection, small impact, and simple device maintenance Effect

Active Publication Date: 2011-03-16
CHINA INSTITUTE OF ATOMIC ENERGY
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Problems solved by technology

Of course, X-ray spectroscopic analysis also has its disadvantages: (1) when measuring in a light matrix, such as an aqueous solution, the scattering background is relatively large, which limits the improvement of the peak-to-background ratio, thus affecting the improvement of the measurement sensitivity; (2) and γ Compared with X-rays, the energy of X-rays is lower, so the matrix absorption effect is larger; (3) The analysis of light elements below Na is more difficult
Chinese patent ZL200510117873.1 discloses an X-ray fluorescence analysis device, which does not consider the radioactive protection of the measurement sample
The more commonly used method is to install all the devices directly into the glove box, but the glove box has limited volume and is inconvenient to install
Especially for the X-ray tube excitation system, because the X-ray tube needs high-voltage power supply, cooling water and other equipment, the device has problems, and it is difficult to overhaul and maintain; at the same time, the X-ray tube is also a consumable item. Once the X-ray tube reaches the end of its service life, it needs to be replaced. X-ray tubes are very difficult; the detector is a very delicate electronic device, and there is a large amount of radioactive material in the glove box, which also affects its performance; Corrosion of electronic components

Method used

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Embodiment Construction

[0016] The technical solution of the present invention will be further explained below in conjunction with the accompanying drawings.

[0017] Such as figure 1 As shown, a graphite crystal pre-diffraction X-ray fluorescence analysis device consists of an X-ray excitation system 1, a sample box 5, a graphite crystal diffraction optical path 8, a Si-PIN detector multi-channel system 9, a computer data acquisition and processing system, etc. 10 composition. Among them, the X-ray tube excitation system 1 adopts a 100-250W low-power high-voltage generator, and the operating voltage and current are 30-50kV and 1-5mA respectively. It is matched with a low-power Ag target or Rh target X-ray tube. The detector of the detector multi-channel system 9 adopts a Si-PIN detector, and a graphite crystal pre-diffraction device 8 is added between the detector and the sample 5 to eliminate the influence of the radioactivity of the sample 6 itself. The sample box 5 is injection molded from pol...

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Abstract

The invention relates to X-ray fluorescence analysis technology and discloses an X-ray fluorescence analysis device. The device comprises an X-ray excitation system, a sample box for storing samples, a graphite crystal diffraction light path, a probe multi-channel system, and a computer data acquisition and processing system and the like, wherein the sample box is arranged in a glove box, the other systems are all arranged outside the glove box, and a light material is adopted for sealing a window. The proposal meets the requirement of the protection, the device has simple maintenance, and electronic equipment is little influenced.

Description

technical field [0001] The invention relates to X-ray fluorescence analysis technology, and specifically discloses an X-ray fluorescence analysis device. Background technique [0002] X-ray fluorescence analysis has a series of advantages: (1) Non-destructive analysis can be realized. The sample can be directly returned to the process without any change after analysis; (2) The wavelength of the characteristic X-ray fluorescence is not affected by the valence state of the element. This has special significance for the concentration analysis of plutonium and neptunium in the reprocessing process of power reactor spent fuel, because the valence states of plutonium and neptunium are complex and changeable; (3) the concentration range of analysis is wide, from trace to constant can be analyzed; (4 ) can be used for simultaneous determination of multiple elements, including simultaneous determination of uranium, plutonium, neptunium, etc.; Less line interference, good accuracy a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
Inventor 郑维明黄清良宋游吴继宗刘桂娇
Owner CHINA INSTITUTE OF ATOMIC ENERGY
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