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Method for estimating and reporting the life expectancy of flash-disk memory

一种预期寿命、存储器的技术，应用在使用存储的程序进行程序控制、静态存储器、存储器系统等方向，能够解决存储设备健康状态恶化的早期阶段不太敏感等问题

Active Publication Date: 2009-09-09
WESTERN DIGITAL ISRAEL LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This aspect makes this prior art approach less sensitive to the early stages of storage device health deterioration

Method used

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  • Method for estimating and reporting the life expectancy of flash-disk memory
  • Method for estimating and reporting the life expectancy of flash-disk memory
  • Method for estimating and reporting the life expectancy of flash-disk memory

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Embodiment Construction

[0063] The invention relates to a method for internal detection of reliability degradation in digital storage devices. The principles and operation of internal detection of reliability degradation in digital storage devices according to the present invention may be better understood with reference to the accompanying description and drawings.

[0064] Referring now to the accompanying drawings, figure 2 Shown is a quality analysis graph of level degradation of a data page (or block) of a storage device as a function of time according to a preferred embodiment of the present invention. As mentioned above, the level may represent a page or a block depending on the operation. figure 2 The curves in represent the respective ranks of the pages or blocks of the storage device. Consider such a curve 30 below. The initial health of a page / block of the curve 30 is defined as the deviation of the initial level of the curve 30 (at t=0, ie at the time of production / testing of the mem...

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Abstract

The present invention provides a method for managing a memory device, a memory device so managed and a system that includes such a memory device. A value of a longevity parameter of the device is monitored after a data operation on the device in which the monitoring is performed by the device. A grade of the device is derived from the value. Preferred longevity parameters include a ratio of successfully-processed data to unsuccessfully-processed data and a deviation in a power consumption of the device. The grade serves as a forecast of a life expectancy of the memory. Preferred grades include: a comparison grade, a maximum grade, and an average grade.

Description

technical field [0001] The present invention relates to built-in detection methods of reliability degradation in digital storage devices in general, and in removable flash memory devices in particular. Background technique [0002] Digital storage devices are often used as reliable storage devices for important data. Due to the complexity and limited life expectancy of such devices, digital storage devices can fail and result in the loss of valuable data. Nonvolatile storage systems include memory and control systems, sometimes on the same silicon die. One of the tasks performed by a control system is error correction. [0003] The error correction code (ECC) detects occasional errors in data due to the nature of the storage element or the characteristics of the operating environment, compensates for the errors, and provides corrected original information at the user's request. ECC systems have inherent limitations on the number of errors that can be corrected. When too ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/00G11C11/34
CPCG11C16/349G11C2029/5002G11C29/42G11C29/52G11C16/04G11C29/50G11C2029/0409G06F9/06G06F12/00G06F13/00
Inventor E·贝奇克夫A·梅厄A·泽尔格勒I·波姆兰兹
Owner WESTERN DIGITAL ISRAEL LTD