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Pulse eddy nondestructive testing method based on time gate

A pulsed eddy current and non-destructive testing technology, applied in measuring devices, instruments, material analysis by electromagnetic means, etc., can solve problems such as the inability to visually display component defects, and achieve the effects of easy implementation, accurate detection effect, and convenient detection.

Active Publication Date: 2009-11-18
林俊明
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Whether the impedance analysis method is used to process the extracted signal or the spectrum analysis method is used to process the extracted signal, the existing eddy current testing methods cannot intuitively show the status of component defects (such as cracks)

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] Embodiment 1, a pulsed eddy current nondestructive testing method based on a time gate of the present invention includes the following steps:

[0030] a. Place the array eddy current sensor close to an array area on the surface of the component for scanning detection. At each array point position in the array area, an arbitrary waveform generator applies a preset voltage to the excitation winding of the eddy current sensor at each array point position respectively. A pulse excitation signal of a certain frequency;

[0031] The array eddy current sensor is composed of a plurality of eddy current sensors arranged in an area array, and the plurality of eddy current sensors arranged in an area array respectively cover each array point position in the array area of ​​the member; the arbitrary waveform generator is opposite to each eddy current sensor in the area array The incentives applied are time-sharing incentives or real-time incentives;

[0032] When time-sharing exci...

Embodiment 2

[0045] Embodiment 2, a pulsed eddy current nondestructive testing method based on a time gate of the present invention includes the following steps:

[0046] a. Place the array eddy current sensor close to an array area on the surface of the component for scanning detection. At each array point position in the array area, an arbitrary waveform generator applies a preset voltage to the excitation winding of the eddy current sensor at each array point position respectively. A pulse excitation signal of a certain frequency;

[0047] The array eddy current sensor is composed of a plurality of eddy current sensors arranged in a linear array, and the plurality of sensors arranged in a linear array move in one direction and cover each array point position in the array area of ​​the member; The excitation applied by each eddy current sensor is time-sharing excitation or real-time excitation;

[0048] When time-sharing excitation is used, the excitation windings of each eddy current s...

Embodiment 3

[0060] Embodiment 3, a pulsed eddy current nondestructive testing method based on a time gate of the present invention is different from Embodiment 2 in that the array eddy current sensor is composed of a single eddy current sensor arranged in a lattice, forming one of the lattices The sensor moves along two perpendicular directions of X and Y to cover each array point position of the array area of ​​the member.

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PUM

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Abstract

The invention discloses a pulse eddy nondestructive testing method based on a time gate, which is characterized in that an array eddy sensor is closely attached to an array area on the surface of a component for scanning and testing; any waveform generators respectively apply a prearranged pulse excitation signal with a certain frequency to the excitation windings of the eddy sensor at each array point position; the eddy sensing signals generated by the pulse excitation signal in the component are respectively picked up by the test windings of the eddy sensor at each array point position; the time gate way is used for extracting the amplitude data of the eddy sensing signals of the eddy sensor at each array point position; and the scanning area of the imaged tested component can intuitively display the defect state of the tested component by calculating the relative amplitude of the eddy sensing signals of the eddy sensor at array point position in the array area and carrying out gray treatment on the relative amplitude. The method has the advantages of convenient testing, easy realization and accurate testing results.

Description

technical field [0001] The invention relates to a nondestructive testing method, in particular to a pulsed eddy current nondestructive testing method based on a time gate. Background technique [0002] Non-destructive testing NDT (nondestructive test) is a detection method that does not damage or affect its future performance or use on materials or workpieces. By using NDT, defects existing in the interior and surface of materials or workpieces can be found, and workpieces can be measured. It can determine the internal composition, structure, physical properties and state of materials or workpieces. Non-destructive testing technology has been widely used in various industrial fields, such as manufacturing, aerospace, petrochemical and other fields. Existing conventional nondestructive testing methods mainly include radiographic testing (RT) methods, ultrasonic testing (UT) methods, penetrant testing (PT) methods, magnetic particle testing (MT) methods, eddy current testing ...

Claims

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Application Information

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IPC IPC(8): G01N27/90G01N27/9013G01N27/904
Inventor 林俊明
Owner 林俊明