Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Detection machine station with contact impedance detection device

A contact impedance and detection device technology, applied in the direction of measuring devices, measuring resistance/reactance/impedance, measuring electrical variables, etc., to improve the detection rate, reduce regular downtime calibration operations, and ensure the effect of excellent rate

Inactive Publication Date: 2009-11-18
CHROMA ELECTRONICS SHENZHEN
View PDF0 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] The purpose of the present invention is to provide a detection machine with a contact impedance detection device, aiming to solve the problem that the detection machine detects its own faults

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Detection machine station with contact impedance detection device
  • Detection machine station with contact impedance detection device
  • Detection machine station with contact impedance detection device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0029] Please refer to Figure 4 , shows the first embodiment of the present invention, the detection machine 3 is used to detect circuit components such as light-emitting diode crystals 6, in this embodiment, the light-emitting diode crystals 6 are carried on the bearing base 40, and are transformed by the bearing base 40 to be tested position; the detection machine platform provided by the embodiment of the present invention can also be used to detect other circuit components carried on a standard carrier tray; the detection machine platform 3 includes: two pairs of pressure conducting devices...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention is suitable for the technical field of circuit component tests, and provides a detection machine station with a contact impedance detection device, used for detecting a circuit component to be tested. The detection machine station comprises a pressure conduction connecting device, an electric signal supply sensing device and the contact impedance detection device which comprises a set of standard components with known electric characteristics and a set of transfer switches, wherein the transfer switches are used for switching the pressure conduction connecting device to the standard components by electric connection, is provided for the electric signal supply sensing device to sense, and comprises contact impedance of an electric circuit of the pressure conduction connecting device and the standard components.

Description

technical field [0001] The invention belongs to the technical field of circuit component detection, and in particular relates to a detection machine with a contact impedance detection device. Background technique [0002] Since the advent of LED (Light Emitting Diode), compared with traditional light sources, in addition to the advantages of energy saving, low temperature and long life, its efficiency has been greatly improved with the improvement of the production process, and its application fields have become more extensive. A single LED is mostly used such as small Toys, handheld devices and mobile phones, multiple LEDs are often used in lamps, automobiles and traffic signs in daily life. LED manufacturing and quality inspection at various stages are of great significance to ensure the quality of LEDs. [0003] In the process of automatic detection of LED crystals, a structure such as figure 1 The shown pin pressure monitoring sensor (edge ​​sensor) 1 uses a fine probe ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02G01R31/28G01R31/26
Inventor 林瑞发陈正雄刘衍庆蔡圣宏
Owner CHROMA ELECTRONICS SHENZHEN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products