Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Non-contact dynamic profile measuring method and measuring device

A topography measurement, non-contact technology, applied in the field of laser applications, can solve the problems of lack of measurement methods and measurement devices, and achieve the effect of easy operation and maintenance, convenient use and simple method.

Inactive Publication Date: 2010-01-06
魏润杰
View PDF0 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a lack of suitable measuring methods and measuring devices in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Non-contact dynamic profile measuring method and measuring device
  • Non-contact dynamic profile measuring method and measuring device
  • Non-contact dynamic profile measuring method and measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0028] attached figure 1 ~ attached image 3 They are respectively a schematic diagram of the dynamic profile measurement device of the present invention, a top view schematic diagram of the dynamic profile measurement device, and a front view schematic diagram of the dynamic profile measurement device, including a laser 1 emitting monochromatic light, a digital camera 3 and a computer 5, and the digital camera communicates with an image acquisition card The computer 5 is connected, and said laser is a sheet light source monochromatic laser, that is, a monochromatic laser with a sheet light source 2, and said laser 1 is arranged directly in front of the measured object 6, directly facing the measured object , that is: the plane where the sheet light is located is perpendicular to the surface plane of the measured object, the center line 14 of the laser sheet...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a non-contact dynamic profile measuring method and a measuring device. A monochromatic laser with a sheet laser is arranged in front of a measured object, and the plane of the sheet laser is vertical to the plane of the measured object. A digital camera with a narrow bandpass filter is arranged in side front of the measured object, and strongest laser energy is irradiated to a measuring area of the measured object. The camera shoots concave and convex changed images of the measured object, and the shot images are input into a computer through an image acquisition card and are compared with a target image with a known depth gradient so as to calculate the dynamic data of appearance profile changes of the measured object. Only a low-price semiconductor laser can filter intense light background noise without an expensive high-energy pulse laser, and the semiconductor laser has strong capacity of resisting disturbance, can measure dynamic profile change data of an object under high-temperature flame environment in a non-contact mode and has accurate measurement and calculation result. Required equipment is simple and easy to use, operate and maintain.

Description

technical field [0001] The invention relates to the technical field of laser applications, in particular to a non-contact dynamic profile measurement method and a measurement device. Background technique [0002] Topography measurement problems are often encountered in real work. For example, when performing ablation tests on some high-temperature-resistant materials, it is necessary to dynamically measure the ablation situation; Measurements are required to ensure proper use. However, there is a lack of suitable measuring methods and measuring devices in the prior art. Contents of the invention [0003] The object of the present invention is to provide a convenient and accurate non-contact dynamic profile measurement method and a simple-structured and easy-to-use measuring device to make up for the deficiencies in the prior art. [0004] The object of the present invention is achieved through the following technical solutions, a non-contact dynamic profile measurement m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G01B11/22G01B11/02
Inventor 魏润杰虞建程欢庆
Owner 魏润杰
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com