Device having circuit capable of intermittent operation

Abstract

A circuit unit is provided. The circuit unit has an intermittent operation circuit. The intermittent operation circuit is set in an operation state and in a stand-by state periodically. An operation mode control unit generates a test mode control signal to designate either an operation test mode or an intermittent operation test mode of the intermittent operation circuit. The operation test mode corresponds to one of a continuous operation or a predetermined time period operation of the intermittent operation circuit. An operation timing generation unit receives the test mode control signal. The operation timing generation unit produces an operation control signal based on the test mode control signal. The operation control signal is outputted to the intermittent operation circuit to operate or wait the intermittent operation circuit.

Description

technical field [0001] The present invention relates to a device having a circuit capable of intermittent operation in standby mode. Background technique [0002] In recent years, with the progress of miniaturization, integration, and high-speed operation of semiconductor elements, in semiconductor devices such as highly integrated system LSIs and SoCs (System on a Chip), leakage currents during standby (stand-by) cause power consumption is increasing. In mobile devices and the like that require lower power consumption, it is necessary to reduce power consumption during standby. In order to reduce power consumption during standby, techniques for intermittently cutting and supplying electric power to circuits that do not need to operate during standby are widely used in various fields. A semiconductor device employing such a technique is disclosed in JP-A-2003-188798. [0003] When performing a test of such a semiconductor device, since an operation test cannot be performe...

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Problems solved by technology

[0003] In the case of testing such a semiconductor device, since the operation test cannot be performed during the standby period, a standby time occurs in the test device, and the time as a whole test process (process) becomes longer.

[0004] Furthermore, there is a problem that the test needs to be performed in consideration of the timing of intermittent operation depending on the type of semiconductor device, which imposes constraints on test equipment or test control software.

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