Feedback low-temperature bending test method and device for wire harness

A bending and wire harness technology, applied in the field of electronic component testing, to achieve intelligent control, experimental process and objective results

Active Publication Date: 2010-06-23
QIMING INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In short, as an experimental device, it should have the characteristics of stability, repeatability and measurability. The current low-temperature bending test device for wire harness can no longer meet such requirements.

Method used

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  • Feedback low-temperature bending test method and device for wire harness
  • Feedback low-temperature bending test method and device for wire harness
  • Feedback low-temperature bending test method and device for wire harness

Examples

Experimental program
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Embodiment Construction

[0020] according to figure 1 As shown, the operation instructions input from the keys of the human-computer interaction unit are converted into control signals by the single-chip control system (ECU) and sent to the motor controller in the power output unit. The motor controller controls the operation of the stepping motor to provide stability for the bending action execution unit. driving force. The bending action execution unit provides feedback signals to the single-chip microcomputer control system through the incremental encoder installed at the rotating shaft while bending the tested wire harness. On the one hand, the feedback signal is used as the control signal of the single-chip control system (ECU), and after being processed by the single-chip control system (ECU), the experimental feedback information such as bending frequency and bending times can be observed in real time through the LCD liquid crystal screen of the human-computer interaction unit; The aspect sav...

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PUM

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Abstract

The invention discloses a feedback low-temperature bending test method for a wire harness. An incremental encoder is arranged on a motion shaft of a wire harness bending mechanical structure and provides a feedback signal for a singlechip control system. The bending frequency and times and other test information can be observed through a man-machine interaction unit after the singlechip control system processes the feedback signal. An operational order input from the man-machine interaction unit is transmitted to the singlechip control system, and converted into a control signal of a motor controller. The motor controller controls the work of a stepping motor to provide a stable driving force for a bending action execution unit, and the conduction and the test finishing alarm of the tested wire harness in the bending process are monitored through a wire harness on-off feedback circuit and a test finishing alarm circuit. The method overcomes the defects of simple test data, no feedback, subjective judgment, and the like of the conventional devices for the low-temperature bend test for the wire harness.

Description

technical field [0001] The invention discloses a feedback-type wiring harness low-temperature bending experiment method, and provides an experiment device suitable for the method, belonging to the technical field of electronic component detection. Background technique [0002] The bending of the wire harness at low temperature is common in real life, especially in the northern region where the winter climate is cold and dry, which makes the bending of the wire harness in a low temperature environment intensify the damage to the surface insulation layer of the wire harness and the inner core of the wire harness, which makes the service life of the wire harness It is greatly reduced, and the reliability of products using this type of wiring harness is also reduced. [0003] The wire harness low temperature bending test device is an essential equipment for testing the service life of the wire harness in the low temperature environment in the laboratory. The simulation test is c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/32G01R31/02
Inventor 王鑫吕楠边增远陈兆莹董杨韩润哲李禄源
Owner QIMING INFORMATION TECH
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