Method for preprocessing near-infrared diffuse reflection spectrum data of corn variety seeds

A spectral data and near-infrared technology, applied in the field of signal processing, can solve the problems of difficult effective extraction of characteristic data points and excessive data processing, and achieve the goal of reducing data processing, large differences, and reducing the amount of data calculation and storage Effect

Inactive Publication Date: 2010-07-28
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Problems solved by technology

[0006] In view of this, the main purpose of the present invention is to provide a method for preprocessing the near-infrared diffuse reflectance spectrum data of corn va

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  • Method for preprocessing near-infrared diffuse reflection spectrum data of corn variety seeds
  • Method for preprocessing near-infrared diffuse reflection spectrum data of corn variety seeds
  • Method for preprocessing near-infrared diffuse reflection spectrum data of corn variety seeds

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[0026] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0027] Such as figure 1 as shown, figure 1 It is a flow chart of a method for preprocessing the near-infrared diffuse reflectance spectrum data of corn variety seeds provided by the present invention, and the method includes:

[0028] Step 1: Select a certain range of near-infrared diffuse reflectance spectral data from the near-infrared diffuse reflectance spectral data of corn variety seeds;

[0029] Step 2: Discrete Fourier transform is performed on the selected near-infrared diffuse reflectance spectrum data to obtain the transformed result data;

[0030] Step 3: Select the amplitude part of the data from the transformed result data as the preprocessing result.

[0031] Selecting a certain range of near-infrared di...

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Abstract

The invention discloses a method for preprocessing near-infrared diffuse reflection spectrum data of corn variety seeds, comprising the following steps of: selecting a certain range of near-infrared diffuse reflection spectrum data from the near-infrared diffuse reflection spectrum data of the corn variety seeds; carrying out discrete forurier transform on the selected near-infrared diffuse reflection spectrum data to obtain transform result data; and selecting the amplitude of the data as a preprocessing result from the transform result data. The invention has more concentrated data characteristic points (i.e. points with large Qm values) relative to initial data by using DFT data of a wave band from 4000 cm<-1> to 7085 cm<-1> as characteristic data and easy characteristic point extraction; and besides, because the DFT data are symmetrical in regard to a central axis of the data, and Qm data obtained by corresponding computation are also symmetrical in regard to the central axis of the data, the first half part of the data is extracted during processing, therefore, not only the processing speed can be increased, but also the data storage space can be saved.

Description

technical field [0001] The invention relates to the technical field of signal processing, in particular to a method for preprocessing the near-infrared diffuse reflectance spectrum data of corn variety seeds. Background technique [0002] Maize is an important crop, and the identification of maize seed varieties is one of the important issues in agricultural production, crop breeding and seed inspection. Existing commonly used methods for seed variety identification include morphological methods, fluorescence scanning identification methods, chemical identification methods and electrophoresis identification methods. The identification time required by the morphological method is long and the accuracy is not high; the identification accuracy of the fluorescence scanning identification method, chemical identification method and electrophoresis identification method is high, but it takes a long time and the identification process is cumbersome, so it is not suitable for batch a...

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Application Information

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IPC IPC(8): G01N21/49
Inventor 李阳鹏李卫军
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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