Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Memory test method

一种内存测试、内存的技术,应用在软件测试/调试、静态存储器、仪器等方向,能够解决不够、不严谨、提高成本等问题,达到应用广泛、小系统资源开销、测试范围广泛的效果

Inactive Publication Date: 2010-08-25
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method increases costs due to the need to purchase test equipment
[0004] In addition, when using the software method to test the memory at present, it is usually only to simply copy the data bus 1 / 0 test and the address bus 1 / 0 test in the test theory, which is not enough and not rigorous.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory test method
  • Memory test method
  • Memory test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Referring to FIG. 1 , it is an implementation flowchart of a preferred embodiment of the memory testing method of the present invention.

[0014] Step S10, performing a simple data reading and writing test on the memory. Please refer to FIG. 2 for the method flow of the simple data reading and writing test. First, in step S100, multiple unoccupied memory physical addresses are acquired. Step S101, select one of the above physical addresses, and write any data into the storage space corresponding to the physical address. Wherein, there is no special requirement for the content of the written data, but the bit width of the data is required to be equal to the system bit width. The system bit width refers to the number of bits of data that the CPU can process each time. Step S102, reading out the data written into the storage space corresponding to the physical address. Step S103, judging whether the written and read data are the same. If the two pieces of data are not...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a memory test method, comprising: carrying out simple data write and read test on the memory; carrying out a data bus walking 1 / 0 test to the memory; carrying out an address bus walking 1 / 0 test to the memory; and carrying out the write and read test on the random data block of the memory. The invention provides a precise and comprehensive memory test method.

Description

technical field [0001] The invention relates to a testing technology of a computer system, in particular to a memory testing method. Background technique [0002] Memory is the main component in personal computers, servers, and embedded systems, and it is relative to external memory. The programs we usually use, such as operating systems, typing software, game software, etc., are generally installed on external storage such as hard disks, but the functions of the programs cannot be used for this alone, and they must be loaded into the memory to run. to actually use the program. For example, we usually input a piece of text or play a game, which are actually carried out in memory. The performance of the memory directly affects the overall performance of the system, therefore, the memory test is an essential test item. [0003] Currently, the more common way to test memory is to use test equipment. However, since this method requires the purchase of test equipment, it incr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG11C29/10
Inventor 童默颖洪学文唐庆宗
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products