Memory test method
一种内存测试、内存的技术,应用在软件测试/调试、静态存储器、仪器等方向,能够解决不够、不严谨、提高成本等问题,达到应用广泛、小系统资源开销、测试范围广泛的效果
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[0013] Referring to FIG. 1 , it is an implementation flowchart of a preferred embodiment of the memory testing method of the present invention.
[0014] Step S10, performing a simple data reading and writing test on the memory. Please refer to FIG. 2 for the method flow of the simple data reading and writing test. First, in step S100, multiple unoccupied memory physical addresses are acquired. Step S101, select one of the above physical addresses, and write any data into the storage space corresponding to the physical address. Wherein, there is no special requirement for the content of the written data, but the bit width of the data is required to be equal to the system bit width. The system bit width refers to the number of bits of data that the CPU can process each time. Step S102, reading out the data written into the storage space corresponding to the physical address. Step S103, judging whether the written and read data are the same. If the two pieces of data are not...
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