Motion sensing method and motion sensing device using the same

A technology of motion sensing and light sensing, which is applied to devices that measure the time required to move a certain distance, measuring devices, and acceleration measurements using inertial force. It can solve the problems of difficult assembly, complex optical design, and difficulty in maintaining high Sensitivity and other issues

Inactive Publication Date: 2010-09-08
SITRONIX TECH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main disadvantage of piezoelectric sensing devices is that the resistance of the piezoelectric material changes with temperature, so it is difficult for piezoelectric sensing devices to maintain high sensitivity
Although using interference light to measure physical quantities can obtain more accurate acceleration values, the optical design for light interference is complicated, and assembly requires good calibration, making assembly difficult

Method used

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  • Motion sensing method and motion sensing device using the same
  • Motion sensing method and motion sensing device using the same
  • Motion sensing method and motion sensing device using the same

Examples

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Embodiment Construction

[0119] In order to have a further understanding and understanding of the structural features of the present invention and the achieved effects, the preferred embodiments and accompanying drawings are used for a detailed description, as follows:

[0120] figure 1A schematic side sectional view of a motion sensing device 100 according to an embodiment of the present invention is shown. The motion sensing device 100 disclosed in an embodiment of the present invention is a micro-electro-mechanical device, which includes a light sensing device 102 , a proof mass 104 , and a light source 106 . The photo-sensing element 102 is formed on a substrate 108 for sensing an irradiating light. The light source 106 is disposed above the light-sensing component 102 and faces the light-sensing component 102 , so that the irradiated light generated by it can be directed to the light-sensing component 102 . The mass block 104 is a movable part in a micro-electro-mechanical component, which can ...

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Abstract

The invention relates to a motion sensing method, which comprises the following steps: providing a photosensing assembly for one side of a movable piece, wherein the movable piece is positioned in a microcomputer electric assembly and the motion of the movable piece reflects the stress of the microcomputer electric assembly; providing a light source for the other side of the movable piece, which is opposite to the photosensing assembly, wherein the light source generates irradiating light for irradiating the movable piece which can shade partial irradiating light, so that the irradiating light locally irradiates the photosensing assembly; capturing a plurality of light and shade images from the photosensing assembly; and analyzing the change of light and shade areas in the light and shade images so as to decide the motion of the movable piece.

Description

technical field [0001] The present invention relates to a motion sensing method and device, in particular to a motion sensing method for measuring the movement or vibration of a mass block or film by using the pattern or area change of a bright or dark area on an optical image sensor and devices. Background technique [0002] Some applications of microelectromechanical systems are accelerometers for detecting the translational acceleration of objects, gyroscopes for sensing the angular velocity of objects, or microphones for sensing sound signals, etc. It uses the movement or vibration of the mass block or film in the micro-electro-mechanical system to present in the form of electrical signals to reflect the sensed physical quantities. Due to the increasing demand for sensing objects on various physical quantities and the requirement for miniaturization of measuring devices, micro-electromechanical systems are gradually used in the field of measurement of related physical q...

Claims

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Application Information

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IPC IPC(8): G01P3/68G01P15/03G01H9/00
Inventor 翁焕翔
Owner SITRONIX TECH CORP
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