Method for correcting temperature-causing changes in process of detecting oxygen and nitrogen analyzer thermal conductivity cell
A technology of detection process and thermal conductivity cell, applied in the direction of material resistance, etc., can solve the problems of wasting time and wasting carrier gas, saving time and gas, and correcting the effect of voltage
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[0015] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:
[0016] In order to solve the problems of the technologies described above, the present invention is achieved through the following steps (as figure 1 shown): is achieved through the following steps:
[0017] 1. At the beginning of the experiment, only the carrier gas is introduced to collect the voltage value data output by a thermal conductivity cell, and the average value is taken as a reference point;
[0018] 2. Based on this reference point, calculate the slope of the straight line formed by each collected data and the reference point; each of the collected data is continuously collected by the AD sampling card at a fixed time interval. The voltage output by the cell;
[0019] 3. The starting point of the waveform: when the rate of change of this slope exceeds the preset range compared with the previous slope, this point is the starting p...
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