Software defect positioning method based on relative redundant test set reduction

A technology for redundant testing and software defects, applied in software testing/debugging, etc., can solve problems such as the decline of defect location effects

Inactive Publication Date: 2010-10-20
NANJING UNIV
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Problems solved by technology

[0006] The technical problem to be solved by the present invention is to propose a defect location method based on relatively redundant test set reduction, which can maintain or improve the defect location under the premise of maintaining low cost of testing, aiming at the decline of the defect location effect caused by the traditional test set reduction algorithm. The effect of positioning

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  • Software defect positioning method based on relative redundant test set reduction
  • Software defect positioning method based on relative redundant test set reduction
  • Software defect positioning method based on relative redundant test set reduction

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Embodiment Construction

[0030] Such as figure 1 , the software defect localization framework based on relatively redundant test set reduction is composed of four modules: test information collection, test set reduction, relative redundant test case selection, suspicion rate calculation and defect localization report generation. The test information collection module collects and organizes relevant information of the test cases; the test set reduction module reduces the test set according to the relevant redundancy judgment standard; the relative redundancy test case selection module selects the representative The set of test cases is added back; the final suspicion rate calculation and defect location report generation module calculates the suspicion rate based on the results to further generate a defect location report.

[0031] The general flow chart of the present invention is as figure 2 shown. The first is the collection and arrangement of test information. Step 1: First, instrument the sour...

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Abstract

The invention discloses a software defect positioning method based on relative redundant test intensive reduction, which comprises the following steps: carrying out pitching piles to a source program, executing a test case, and collecting the execution information of the test case; carrying out the reduction to the whole test set according to the covering condition of a source code of the test case; and finally, calculating doubting rate of a statement block and sorting the statement block according to the doubting rate to generate a defect position report. Under the premise of using the same defect position technology, the defect position effect calculated by a representational set, obtained by the invention, is better than the defect position effect calculated by the representational set, obtained the traditional test set reduction, and the phase differences of scales of representational sets are not more.

Description

technical field [0001] The present invention relates to a method for locating defects in software automation testing, especially in the case of a large number of test cases, in order to effectively reduce the test cost, the test set is reduced on the basis of maintaining the coverage of the original statement block; in order to avoid a large number of tests The loss of information leads to a decline in the effect of defect location, and then by adding some redundant test cases to the reduced representative set to maintain or improve the effect of defect location. Background technique [0002] With the continuous change of modern large-scale software versions, the scale of test sets has also become huge, and the cost of software testing has also increased. The test set reduction technology is considered to solve such problems, it can find a smaller subset of the original test set, and can meet the original test requirements, such as statement block coverage, branch coverage, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 张鑫顾庆庄元陈道蓄
Owner NANJING UNIV
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