Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Extraction method of histogram texture descriptor in muti-contrast mode

An extraction method and histogram technology, applied in the field of image processing, can solve the problem that the technology of SAR image ground object classification has not yet appeared, and achieve the effect of high efficiency, simplicity and good expression of texture features.

Inactive Publication Date: 2010-11-24
WUHAN UNIV
View PDF2 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, the technology that facilitates the classification of SAR image features by these scattering characteristics has not yet appeared in this field

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Extraction method of histogram texture descriptor in muti-contrast mode
  • Extraction method of histogram texture descriptor in muti-contrast mode
  • Extraction method of histogram texture descriptor in muti-contrast mode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] Four basic scattering models based on microwave imaging (such as figure 1 ), different ground objects show different scattering characteristics in the process of SAR imaging, and the present invention proposes that the difference of ground object categories in SAR images is mainly reflected in two aspects: black, gray, and white (target) in the image The size of the area and the contrast strength of these patterns in the image. The present invention studies the discriminative ability of these modes for the classification of SAR image features for the above two attributes, and proposes a feature description extraction scheme. See the specific process figure 2 .

[0015] The principle and related definitions of the multi-contrast local pattern histogram feature descriptor will be described below through an embodiment.

[0016] (1) Image quantization

[0017] The gray value of all pixels in the sliding window must be compared with the gray value of the center pixel and...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an extraction method of a histogram texture descriptor in a muti-contrast mode, comprising the following steps: carrying out image quantization; separating the quantized image into a positive matrix, a negative matrix and an equivalent matrix; and carrying out histogram calculation according to the three matrixes to obtain the histogram descriptor in a local mode of the image. The technical proposal provided by the invention can achieve efficient and simple extraction of textural features and well express the texture of an SAR image.

Description

technical field [0001] The invention belongs to the field of image processing, in particular to a multi-contrast mode histogram texture descriptor extraction method for SAR images. Background technique [0002] In the process of SAR imaging, different ground objects show different scattering properties, which are determined by the roughness and material of the ground objects. like figure 1 As shown, there are four basic scattering models in microwave imaging, including surface scattering model, diffuse scattering model, even scattering model and volume scattering model. The scattering of SAR in smooth media (such as dry riverbed, road surface, calm water surface, smooth and flat rock, etc.) is mainly manifested as surface scattering. This scattering process is similar to the specular reflection of visible light. The echo energy of the surface scattering model is related to the angle between the incident wave and the scattering surface. When the incident angle is large, t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/46G06K9/38
Inventor 代登信杨文
Owner WUHAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products