Testing device for SAS (Serial Attached SCSI) back plate

Abstract

The invention discloses a testing device for an SAS (Serial Attached SCSI) back plate, which is suitable for testing one SAS back plate. The SAS back plate is provided with a plurality of SAS connecting ports. The testing device for an SAS back plate comprises a control module, a terminal module and a signal returning module, wherein the control module is used for sending a control command; and the terminal module comprises a physical layer integrated circuit and a control element. The control element receives the control command and commands the physical layer integrated circuit to send a testing signal to the SAS back plate. The signal returning module is electrically connected to the SAS back plate and returns the testing signal coming from the SAS back plate to the SAS back plate. The SAS back plate receives the returned testing signal and then sends the returned testing signal to the physical layer integrated circuit. The physical layer integrated circuit compares the returned testing signal with the send testing signal and then records a comparison result.

Description

technical field [0001] The invention relates to a testing device for a SAS backplane, in particular to a device capable of testing a SAS backplane without using a physical SAS device. Background technique [0002] Serial Attached Small Computer System Interface (SAS) is a new generation of Small Computer System Interface (SCSI) standard, and it was developed after Parallel SCSI Brand new interface. The SAS interface can provide multi-point connections, and in the latest SAS3.0 standard, data can be transmitted bidirectionally at a speed of 6Gbps (gigabits per second). In addition, the SAS interface has the advantage of reducing the internal space occupied by the system by reducing the design of the connecting wires. The SAS interface is also backward compatible, for example, it can be connected with a Serial Advanced Technology Attachment (SATA) hard disk. [0003] Please refer to figure 1 , which is a structural schematic diagram of an existing SAS backplane testing dev...

AI Technical Summary

Problems solved by technology

It will take extra time to start the operating system, and the overall test time will be extended accordingly, making the test efficiency low

In addition, this test method needs to prepare multiple physical SAS devices

And if the SAS hard disk is used, the required cost of the test device is increased because the hard disk has a life-span limit of access times.

When trying to test higher-end SAS panels (such as SAS3.0), the old SAS devices may not be able to continue to be used, and the replacement of old devices with new ones also makes this method costly

[0005] The device for testing the SAS backplane based on the above-mentioned prior art has problems such as the inconvenience of the test method, the lengthy test time, and the high cost of the required equipment.

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