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Method for extracting affine invariant feature of image by using M-band wavelet

A technology of affine invariance and wavelet extraction, which is applied to instruments, character and pattern recognition, computer components, etc., can solve the problems that it is difficult to extract affine invariant features of images, and does not have affine invariance, so as to improve The effect of computing speed and reducing computational complexity

Active Publication Date: 2012-06-27
HUNAN VISION SPLEND PHOTOELECTRIC TECH
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  • Application Information

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Problems solved by technology

However, the SIFT method does not actually have complete affine invariance, especially in the case of a large change in viewing angle, it is difficult to extract the affine invariant features of the image using the SIFT method

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  • Method for extracting affine invariant feature of image by using M-band wavelet
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  • Method for extracting affine invariant feature of image by using M-band wavelet

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Embodiment Construction

[0020] The design principle of the present invention is described in detail below in conjunction with accompanying drawing and embodiment:

[0021] Such as figure 1 As shown, the present embodiment provides a method for extracting image affine invariant features using M-advance wavelet, specifically using 3 / 2-advance wavelet transform, that is, M=3 / 2, which includes the following steps:

[0022] The first step is to establish the multi-scale space of the image through the M-advance wavelet transform, and determine the position and scale of the local extremum point by detecting the local modulus maximum of the wavelet coefficient in the multi-scale space:

[0023] (1) Select the wavelet decomposition scale J, the preferred J of this embodiment is 10;

[0024] (2) For each row of f (x, y), carry out incremental j-value two-dimensional M into wavelet transform, 0<j<J;

[0025] (3) found the zero crossing point of

[0026] (4) Calculate the modulus of all wavelet transforms ...

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Abstract

The invention provides a method for extracting affine invariant features of an image by using M-band wavelet. The method comprises the following steps: establishing a multiscale space of the image through the M-band to determine the position of a candidate feature point, namely a local extreme point, and scale thereof; removing unstable candidate points with low contrast ratio, finishing positionof feature regions by taking the rest stable feature points as the center of the feature region; determining the main direction of the feature descriptor by the gradient direction distribution condition of the pixels around the feature points, and rotating the region around the feature points to the main direction; and constructing the feature descriptor with invariant affine according to the gradient information of the region around the feature points. The digital image feature extracted by the method has complete affine invariance.

Description

Technical field: [0001] The invention relates to the extraction of invariant features of digital images, in particular to a method for extracting affine invariant features of images using M-advance wavelets. Background technique: [0002] In many intelligent image processing fields such as image-based target recognition, geometric correction of remote sensing images, and image retrieval, it is often necessary to extract the same feature quantity from multiple images acquired from different viewpoints, and use this feature quantity as the basis for subsequent processing. Since the relationship between images obtained under most viewpoint changes can be approximated by affine transformation, extracting affine invariant features has become a common problem in many technical fields. Detection, physiological lesions, character recognition, fingerprint recognition and many other fields have important application value, and are also the basis of image analysis technologies such as ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/32G06K9/46
Inventor 张茂军徐玮周韬王炜熊志辉
Owner HUNAN VISION SPLEND PHOTOELECTRIC TECH