Device and method for measuring ceramic contractibility rate and dielectric constant

Abstract

The invention relates to a device for measuring ceramic contractibility rate and dielectric constant systematically. The device comprises a low-temperature co-fired ceramic (LTCC) base plate (1), and a first resonant circuit (2) and a second resonant circuit (3) which are arranged on the LTCC base plate (1), have similar structural types and are arranged in parallel, wherein a first rectangle micro-strip ring resonator (4)is arranged in the middle of the first resonant circuit (2), first L-shaped input-put micro-strip lines (5) are arranged at two sides of the first resonant circuit (2), a first coupling gap (6) is left between the first rectangle micro-strip ring resonator (4) and the adjacent end of the first L-shaped input-put micro-strip lines (5), a second rectangle micro-strip ring resonator (7)is arranged in the middle of the second resonant circuit (3), second L-shaped input-put micro-strip lines (8) are arranged at two sides thereof of the second resonant circuit (3), a second coupling gap (9) is left between the second rectangle micro-strip ring resonator (7) and the adjacent end of the second L-shaped input-put micro-strip lines (8), and the other end of each second L-shaped input-put micro-strip line (8) is an input and output port of the second resonant circuit (3).

Description

Technical field [0001] The invention relates to a measuring device and method for ceramics, in particular to a device and method for simultaneously measuring the shrinkage rate and dielectric constant of low-temperature co-sintered ceramics (LTCC). Background technique [0002] LTCC shrinks during the sintering process. When using LTCC as a microwave substrate, in order to ensure electrical performance, the shrinkage rate of LTCC must be known so that it can be corrected during the design process. In addition, when designing a microwave circuit based on an LTCC substrate, it is also necessary to know the dielectric constant of LTCC. Usually, the method of measuring the shrinkage rate of LTCC is to use X-ray equipment to measure the fluoroscopy. This method requires special equipment, which is expensive and requires protection, and the effect is not very good; the method of measuring the dielectric constant of the material includes transmission line method, standing wave method, ...

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Problems solved by technology

Usually the method of measuring LTCC shrinkage is to use X-ray device perspective measurement, this method requires special equipment, expensive equipment and protection requirements, and the effect is not very good; the method of measuring the dielectric constant of materials includes transmission line method, standing wave method, etc. etc. These methods have some requirements on the morphology of material samples, and are not necessarily suitable for LTCC microwave substrates that are actually used.

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