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Current fusing type polycrystal fuse circuit

A fuse and fusing technology, applied in information storage, static memory, instruments, etc., can solve the problems of large area and high chip cost, and achieve the effect of reducing area, reducing chip cost, and saving chip area

Active Publication Date: 2011-05-25
陕西光电子先导院科技有限公司
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  • Summary
  • Abstract
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  • Application Information

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Problems solved by technology

Among them, the current fusing circuit provides current to blow the polycrystalline fuse through the probe during the chip testing process. This technology needs to place pads (PAD) at both ends of the fuse for the probe to contact and provide the current path, so it requires a large area, resulting in higher chip cost, especially when using more fuses, the problem is particularly serious

Method used

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  • Current fusing type polycrystal fuse circuit
  • Current fusing type polycrystal fuse circuit
  • Current fusing type polycrystal fuse circuit

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Embodiment Construction

[0025] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with the embodiments and the accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0026] See attached figure 1 , the current blown polycrystalline fuse circuit provided by the embodiment of the present invention may be specifically composed of an external selection circuit 10 , a polycrystalline fuse 20 , a fusing control circuit 30 and an output latch 40 .

[0027] The external selection circuit 10 involved in the embodiment of the present invention may specifically be connected to a fuse control circuit 30 for receiving an externally input selection signal.

[0028] Specifically, the external selection circuit 10 may be composed...

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Abstract

The invention provides a current fusing type polycrystal fuse circuit. An external selection circuit and a fusing control circuit are arranged for fusing polycrystal fuse wires, thus avoiding the defect that bonding pad is used to fuse the fuse wires in the prior art, reducing the area of the polycrystal fuse circuit, saving the area of a chip, and lowering the cost of the chip. Meanwhile, an output latch is arranged in the polycrystal fuse circuit, thus fusing the fuse wires, and ensuring that standard digital logic level can be output from the circuit at the same time.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuits, in particular to a current fusing polycrystalline fuse circuit. Background technique [0002] With the development of modern communication technology and signal processing technology, the demand for high-speed and high-precision semiconductor integrated circuits is increasing. There are various unsatisfactory factors in the production process of semiconductor chips, and the performance of the produced semiconductor chips is often difficult to meet the requirements of high-precision signal processing while ensuring high-speed signal processing. However, due to cost considerations, it is not the first choice to use more advanced production technology to reduce the unfavorable factors in the production process. However, the trimming of the integrated circuit chip based on the existing technology can often meet the performance and cost requirements at the same time. [000...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C17/16G11C17/18
Inventor 杨银堂高榕李娅妮刘帘曦朱樟明
Owner 陕西光电子先导院科技有限公司
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