Liquid processing apparatus, liquid processing method and storage medium

A storage medium and liquid processing technology, which is applied in the field of liquid processing, can solve the problems that cannot be processed, the exhaust volume of the cup body is expected to be reduced, and the wafer manufacturing efficiency has little contribution, etc.

Active Publication Date: 2011-06-01
TOKYO ELECTRON LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these devices do not mention the subject of reducing the exhaust volume of the cup body.
In addition, since the substrate is cleaned after the liquid treatment, the next wafer cannot be subjected to the liquid treatment during the cleaning, so it does not contribute much to the improvement of the wafer manufacturing efficiency.

Method used

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  • Liquid processing apparatus, liquid processing method and storage medium
  • Liquid processing apparatus, liquid processing method and storage medium
  • Liquid processing apparatus, liquid processing method and storage medium

Examples

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Embodiment Construction

[0057] An embodiment in which the liquid processing device of the present invention is applied to a resist coating device will be described. figure 1 The shown resist coating apparatus has a spin chuck 31 that holds a wafer W horizontally by vacuum suction. The spin chuck 31 can be raised and lowered by a rotary drive unit 32 connected below, and can rotate about a vertical axis. A cup 40 is provided to surround the spin chuck 31 , and the cup 40 is composed of an inner cup 41 and an outer cup 42 .

[0058]The inner cup body 41 is located below the wafer W held by the spin chuck 31, and is composed of an annular guide portion 41a and a horizontal disc portion 41b. The position of the circular plate portion 41 b is connected to the inner periphery of the guide portion 41 a, and the central portion is penetrated by the spin chuck 31 . The above-mentioned guide portion 41 a has a function of guiding (guiding) the flow of the resist liquid spilled from the wafer W. As shown in ...

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PUM

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Abstract

The invention provides a liquid processing apparatus, a liquid processing method and a storage medium.According to the liquid processing apparatus and the liquid processing method, the gas-discharging amount in a cup is inhibited when a rotating substrate is subjected to the solution treatment at the same time.Meanwhile, mist is prevented from rebounding from the cup and the attachment of the mist to the substrate is also avoided.During the discharge period of the resist of a wafer (W), the cleaning fluid is discharged out of a flow path forming member (50) along the inner surface of the outside of the cup body (42).A liquid film of the cleaning fluid is formed on the inner wall of the outside of the cup body (42).The resist swung out by the wafer (W) is caught by the liquid film of the cleaning fluid.After catching the resist, the cleaning fluid is recycled to a chute part (53) arranged at the bottom of the outside of the cup body (42) and is discharged again out of the flow path forming member (50) along the inner surface of the outside of the cup body (42).

Description

technical field [0001] The present invention relates to the technical field of supplying a processing liquid from a nozzle to a substrate such as a semiconductor wafer and performing liquid processing while rotating the substrate. Background technique [0002] In the semiconductor manufacturing process, there is a process of supplying a processing liquid to a substrate and performing liquid processing while rotating the substrate. Specifically, for example, the following steps can be mentioned: a step of supplying a resist solution to the substrate by spin coating; and a step of supplying a solvent for removing the resist on the peripheral edge of the substrate after forming a resist film on the substrate surface. ; the process of cleaning the substrate with a cleaning solution after the development treatment of the substrate; and the process of cleaning the surface of the substrate in order to remove particles, for example. In addition, the cleaning liquid becomes the proc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B05C11/08B05C11/10H01L21/00H01L21/02
CPCG03F7/162H01L21/67051
Inventor 坂本和生
Owner TOKYO ELECTRON LTD
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