High-frequency and high-speed frequency testing system and method based on phase locking technique

Abstract

The invention discloses a high-frequency and high-speed frequency testing system based on a phase locking technique, comprising a standard signal source, a power supply device, a PCB (printed circuit board), a plurality of testing units arranged on the PCB and a data storage and display device, wherein the standard signal source is electrically connected with each testing unit respectively; each testing unit comprises a data acquisition module, a phase locking module and a data distribution module; the data acquisition module is used for acquiring the signal frequency of a tested product correspondingly; the phase locking module is used for carrying out phase comparison on the acquired signal frequency of the tested product and the standard signal source so as to obtain a comparison result, driving the corresponding tested product according to the comparison result and leading the phase of the tested product to be consistently locked with the phase of the standard signal source; and the data distribution module is used for outputting a phase value of the locked tested product to the data storage and display device for storage and display. The invention also discloses a high-frequency and high-speed frequency testing method based on the phase locking technique.

Description

technical field [0001] The invention relates to the technical field of testing, and more particularly to a high-frequency and high-speed frequency testing system and testing method based on phase-locking technology. Background technique [0002] In the frequency test system of the prior art, when the frequency of multiple frequency products is to be tested in batches, the gate method is generally adopted, that is, the frequency output signal of a sub-area is electrically connected with the gate node of the corresponding area, and the sub-area A product in the area corresponds to a sub-node, and the node is equipped with an electronic switch and a drive shaping circuit. The sub-nodes in each sub-area are electrically connected to the main node through logic control products, and the main node is electrically connected to the frequency metering equipment. Through logic control The product frequently performs on-off control on sub-nodes for frequency data measurement. [0003]...

AI Technical Summary

Problems solved by technology

[0003] When using a frequency test system with a traditional architecture to test the frequency of high-frequency and high-speed signals, the output part has special requirements for the wire material, and the length of the connecting wire seriously affects the isolation of the signal channel, and the high-frequency signal is easily interfered, and it is also a source of interference. A common practice is to divide or divide high-frequency signals, but this test method brings about a decrease in test accuracy

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