A kind of aging test system
A technology of aging test and DC power supply, which is applied in the direction of control/regulation systems, instruments, and adjustment of electrical variables, etc., and can solve problems such as phase synchronization, different electronic loads, and electromagnetic interference
Inactive Publication Date: 2011-12-07
许荣维 +1
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Problems solved by technology
However, during the aging test, the load is always consuming power, which will cause a lot of power consumption. With the rising awareness of environmental protection and in the future, reducing energy consumption and waste is a top priority
[0004] In addition, due to the development of technology, the current practice often uses electronic loads for testing purposes, and the required electronic loads are also different depending on the power of the device to be tested and the number of simultaneous tests. When the required electronic load When it is larger, the parallel structure is currently used to meet the required power. However, after the parallel connection, problems such as electromagnetic interference (EMI) or phase synchronization need to be overcome.
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[0040] An aging test system of the present invention will be described below with reference to related drawings, wherein the same components will be described with the same reference symbols.
[0041] Please refer to figure 1 As shown, an aging test system 10 according to a preferred embodiment of the present invention includes a DC power supply device 11 , a power conversion device 12 , an electronic device 13 , and a power recovery device 14 . The electronic device 13 is, for example, a power supply used by a computer, which may have a plurality of input terminals to simulate a load. In addition, the electronic device 13 is electrically connected to the power conversion device 12, and outputs at least one DC driving power DCD according to an AC power AC2.
[0042] Please also refer to figure 1 and figure 2 As shown, the DC power supply device 11 receives an AC power AC1 and outputs at least one DC power DC1. The AC power supply AC1 is, for example, a 110V or 220V AC pow...
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The invention discloses an aging test system, which comprises a DC power supply device, a power conversion device, an electronic device and a power recovery device. The DC power supply device outputs at least one DC power. The power conversion device is electrically connected with the DC power supply device, and generates an AC power according to the DC power supply. The electronic device is electrically connected with the power conversion device, and outputs at least one DC driving power according to the AC power. The power recovery device is electrically connected with the electronic device, and outputs at least one auxiliary DC power to the power conversion device according to the DC driving power.
Description
technical field [0001] The present invention relates to a testing system, in particular to an aging testing system, which performs aging testing on at least one electronic device. Background technique [0002] After the current electronic device is designed and manufactured, in order to improve its production yield and know its durability, a burn-in test or burn-in test is usually performed on the electronic device. [0003] Generally speaking, electronic devices are electrically connected to at least one load (load) when they are used. Therefore, when testing, in order to simulate real usage conditions, loads are also added for testing. Generally, for high-power electronic devices, load meters such as cement resistors are used for simulation. However, during the aging test, the load is always consuming power, which will cause a lot of power consumption. With the rising awareness of environmental protection and in the future, reducing energy consumption and waste is a top p...
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IPC IPC(8): H02M3/325
Inventor 张文念
Owner 许荣维