Sample analyzing apparatus
A sample analysis and sample technology, which is applied in the direction of analyzing materials, measuring devices, and material analysis through optical means, can solve problems such as the relationship between wavelengths that are not considered, and achieve the effect of reducing the number of parts and high-precision measurement results
Inactive Publication Date: 2012-01-04
HORIBA LTD
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Problems solved by technology
[0009] However, this device does not consider the above-mentioned relationship between the optical path length and the wavelength of the irradiated light at all, and is only a device that expands the measurement wavelength range while ensuring the desired wavelength resolution.
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[0037] Next, the sample analysis device 100 of the present invention will be described with reference to the drawings. in addition, figure 1 is a configuration diagram schematically showing the sample analysis device 100 according to the present embodiment, figure 2 is a schematic diagram of incident angles α1, α2 and diffraction angle β of reflected light with respect to the diffraction grating 7 .
[0038]
[0039] Such as figure 1 As shown, the sample analysis device 100 of this embodiment includes: a sample pool part 2, which is used to accommodate samples; a first light source 31 and a second light source 32, which irradiate light in a predetermined wavelength range to the sample pool part 2; a first collimating mirror 61 and the second collimating mirror 62 make the transmitted light passing through the sample pool part 2 become parallel light; the diffraction grating 7 becomes the reflected light that has become parallel light through the first collimating mirror 6...
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Abstract
Provided is a sample analyzing apparatus by which highly accurate measurement results can be obtained. The apparatus is provided with: a sample cell section (2) configuring a plurality of cell spaces (S1, S2); light source sections (31, 32) which irradiate the cell spaces (S1, S2) with light in wavelength regions different from each other; a plurality of collimator mirrors (61, 62), which are arranged corresponding to the cell spaces (S1, S2), respectively, and collimate transmitted light that passed through the cell spaces (S1, S2); a diffraction grating (7) which disperses the reflection light collimated by the collimator mirrors (61, 62); a light collecting mirror (9) which collects light dispersed by means of the diffraction grating (7); and a light detector (10) which detects the light collected by the light collecting mirror (9).
Description
technical field [0001] The present invention relates to a sample analysis device for analyzing component concentrations in a sample using an absorption spectrum obtained by irradiating a sample with light and spectroscopically analyzing the transmitted light transmitted through the sample. Background technique [0002] As shown in Patent Document 1, as the sample analysis device, the light from a light source such as a halogen lamp is condensed by a condenser lens and then irradiated to the sample cell, and the transmitted light after passing through the sample cell is diffracted After the grating is spectroscopic, the absorption spectrum is calculated after detection by a multi-channel detector to analyze the component concentration of the sample. [0003] When measuring the absorbance of a sample using the sample analyzer, the absorbance is most suitable for measurement when the absorbance is about 1 (transmittance 10%) to absorbance 2 (transmittance 1%). This is because ...
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IPC IPC(8): G01N21/27G01J3/18
CPCG01J3/1804G01J3/0208G01J3/02G01N2021/0357G01J3/42G01N21/31G01N21/27G01J3/18
Inventor 横山一成
Owner HORIBA LTD