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Test system

A test system and test signal technology, applied in the test field, can solve the problems of complex circuit configuration and high cost of the test system, and achieve the effect of solving complex circuit configuration and high cost

Active Publication Date: 2014-01-22
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] An object of the present invention is to provide a test system to solve the problems of high cost and complicated circuit configuration of the test system in the prior art

Method used

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Embodiment Construction

[0021] The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the present invention can be practiced.

[0022] see image 3 , which is a schematic diagram of a test system according to a preferred embodiment of the present invention.

[0023] The test system includes a thin film transistor substrate 30, and the thin film transistor substrate 30 includes several thin film transistors T1-T5, several connection pads R1-R5 and a test pad TP. Each thin film transistor T1 - T5 includes a first electrode, a second electrode and a third electrode. In this embodiment, the first electrode is a source S (source), the second electrode is a drain D (drain), and the third electrode is a gate G (gate). The thin film transistors T1 - T5 are components on the thin film transistor substrate 30 that need to be tested.

[0024] In the test system of the present invention, the drains D of the thin film transistors T1-...

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PUM

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Abstract

Disclosed is a test system, comprising a thin-film transistor substrate; the thin-film transistor substrate comprises a plurality of thin-film transistors and a plurality of bond pads; each thin-film transistor comprises a first electrode, a second electrode and a third electrode. The thin-film transistor substrate further comprises a test pad. Of the first electrode and the second electrode of the thin-film transistor, one is electrically connected to one of the bond pads; and the other one, together with the third electrode, is electrically connected to the test pad. The test system of the present invention reduces test system cost and circuit configuration complexity.

Description

【Technical field】 [0001] The invention relates to the technical field of testing, in particular to a testing system capable of reducing testing costs. 【Background technique】 [0002] The liquid crystal display device mainly includes a liquid crystal panel and a backlight module. The liquid crystal panel includes a thin film transistor (Thin Film Transistor, TFT) substrate, a color filter (Color Filter, CF) substrate, and a liquid crystal disposed between the thin film transistor substrate and the color filter substrate layer. [0003] In the polymer stabilization vertical alignment (Polymer Stabilization Vertical Align, PSVA) process, array process (array process), assembly process (cell process) or other processes, it is necessary to test the thin film transistor substrate, check the thin film transistor substrate Whether the components on it, such as thin film transistors, are functioning properly. [0004] see figure 1 , which is a schematic diagram of a test system i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13G01R1/073
CPCG01R1/07385G01R31/2889G02F1/13G01R31/31926
Inventor 陈政鸿
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD