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Automatic test device of vehicle central electric junction box

An automatic test device, the technology of central electric, applied in the direction of measuring device, measuring electricity, measuring electric variables, etc., can solve the problems of low test efficiency, cumbersome operation, poor safety, etc.

Inactive Publication Date: 2014-05-14
TUNG THIH ELECTRONICS (XIAMEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to provide an automatic test device for a central electrical junction box for vehicles, so as to solve the problems of cumbersome operation, low test efficiency and poor safety in the prior art

Method used

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  • Automatic test device of vehicle central electric junction box
  • Automatic test device of vehicle central electric junction box

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Embodiment Construction

[0029] In order to further explain the technical solution of the present invention, the present invention will be described in detail below through specific examples.

[0030] Such as figure 1 As shown, it is a functional block diagram of an automatic test device 100 of a central electrical junction box 400 for a vehicle according to the present invention. Junction box 400 is tested.

[0031] Such as figure 2 As shown, it is a functional block diagram of a preferred embodiment of the present invention, the automatic test device 100 includes a microprocessor 1, a current adjustment circuit 2, a first channel selection circuit 3, a second channel selection circuit 4 and a current detection circuit 5; specific:

[0032] The microprocessor 1 is used as the control center of the entire automatic test device 100. Of course, in actual use, the microprocessor 1 can also be externally connected with a host computer 7, and the microprocessor 1 is specifically controlled by the host ...

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PUM

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Abstract

The invention discloses an automatic test device and relates to the field of vehicle central electric junction boxes. The automatic test device is arranged between positive and negative electrodes of a power supply and a junction box. The automatic test device comprises a microprocessor, and a current adjustment circuit, a first channel selection circuit, a second channel selection circuit and a current detection circuit, which are respectively connected with the microprocessor, wherein the current adjustment circuit automatically changes a load according to the current test requirement of the microprocessor; the first channel selection circuit is connected with the current adjustment circuit in series and positioned between the positive electrode of the power supply and the junction box; the second channel selection circuit is arranged between the junction box and the negative electrode of the power supply; the current detection circuit is positioned between the microprocessor and the junction box, and used for acquiring an actual current which is currently input into the junction box and transmitting an actual current signal to the microprocessor; and the microprocessor controls motion of the current adjustment circuit according to a comparison result. By adoption of the automatic test device, automatic operation is completely realized. The automatic test device has the characteristics of simplicity of operation, high test efficiency and high test reliability.

Description

technical field [0001] The invention relates to the field of automatic testing, in particular to an automatic testing device for a central electrical junction box for vehicles. Background technique [0002] With the continuous improvement of the functions of the central electrical junction box for vehicles, the channels involved in it are also gradually increasing, thus making it more difficult for people to detect the central electrical junction box for vehicles. At present, the test current of the central electrical junction box for vehicles is obtained through manual adjustment under the condition of external actual load. [0003] Therefore, the above-mentioned operation method will have at least the following disadvantages in the face of the continuous development of the central electrical junction box: [0004] 1. Due to the increasing number of channels in the junction box, each channel must be tested for connection / disconnection. Therefore, when testing channels one ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 宋平林志聪余新志
Owner TUNG THIH ELECTRONICS (XIAMEN) CO LTD
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