Examination apparatus for eddy current flaw detector

Abstract

The present invention discloses an examination apparatus for an eddy current flaw detector. The examination apparatus comprises a frequency meter and an oscilloscope, and further comprises a storage unit, a parameter setting unit, a data matching module, a processor and a display unit, wherein the frequency meter and the oscilloscope are provided for synchronously testing the output frequency and the output voltage of the eddy current flaw detector requiring examination during a standard calibration block testing process by using the eddy current flaw detector requiring examination, standard detection data of a plurality of standard calibration blocks is stored in the storage unit, the data matching module is provided for matching the standard calibration block model input through the parameter setting unit with the standard detection data, the processor is provided for analyzing and processing the data tested through the frequency meter and the oscilloscope, comparing the tested data with the matched standard detection data, and obtaining the examination result, and the display unit is provided for synchronously displaying the examination result. The examination apparatus of the present invention has characteristics of reasonable design, convenient wiring, simple operation, good use effect and high intelligence degree. With the examination apparatus of the present invention, the defects of large labor intensity, easy error generating, low intelligence degree, inconvenient use and operation, low examination efficiency and the like in the existing examination apparatus for the eddy current flaw detector are effectively solved.

Description

technical field [0001] The invention relates to a testing device for a flaw detector, in particular to a testing device for an eddy current flaw detector. Background technique [0002] With the continuous development of modern large-scale industrial production, especially the high development of atomic energy, aviation and aerospace technology, non-destructive testing technology has been paid more and more attention by people. Nowadays, the materials used in the industry are gradually replaced by special materials such as high temperature resistance, cutting resistance, precious metals, complex alloys, and composite materials from the original general materials. In addition, the specific performance and high price of the above-mentioned special materials, as well as the strict requirements for personal and product safety guarantees, force the use of detection methods that do not destroy the original shape of the product, do not change or affect the performance of the product...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a verification device for eddy current flaw detectors in view of the deficiencies in the above-mentioned prior art. The eddy current flaw detector verification device has defects such as high labor intensity, prone to errors, low intelligence, inconvenient use and operation, and low verification efficiency.

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