Path delay on-line measurement circuit

Abstract

A path delay on-line measurement circuit comprises a measurement trigger module connected with a to-be-detected circuit, a to-be-detected source selection module connected with the measurement trigger module and controlling signals sent by the measurement trigger module to selectively pass, a delay measurement module connected with the to-be-detected source selection module and carrying out delay measurement to signals sent by the to-be-detected source selection module, a storage module connected with the delay measurement module and storing delay measurement information of the delay measurement module, and a control module for controlling operation of the measurement trigger module, the to-be-detected source selection module and the storage module. The path delay on-line measurement circuit is connected to the to-be-detected circuit, the control module controls the path delay on-line measurement circuit to work in a probe path delay measurement mode so as to measure and obtain delay of each probe path and controls the path delay on-line measurement circuit to work in an on-line delay measurement mode so as to measure and obtain total delay. Finally, the measured probe path delay is subtracted from the total delay, and the delay of the to-be-detected path is obtained.

Description

【Technical field】 [0001] The invention relates to integrated circuit technology, in particular to a path delay on-line measurement circuit for on-line measurement of path delay on some paths in VLSI. 【Background technique】 [0002] With the continuous improvement of the production process of the semiconductor industry, the continuously upgraded VLSI has shown stronger functions and lower costs. But at the same time, the performance of integrated circuits presents more and more significant unpredictability (that is, their performance varies considerably at different times and environments). This is because factors such as deviations in the production process, changes in environmental parameters during work, and aging effects have more and more serious impacts on the performance of integrated circuits. Correspondingly, for the timing correctness of an integrated circuit (the most important performance index of an integrated circuit in most cases), a common test solution is to...

AI Technical Summary

Problems solved by technology

But this test method has become increasingly difficult to ensure timing correctness

The automatic tester itself inevitably introduces measurement errors, which show increasingly serious interference to the measurement of the timing performance of increasingly sophisti...

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