Method for measuring screen plate overlay accuracy of solar cell

A technology of engraving accuracy and screen printing, which is applied to screen printing machines, general parts of printing machinery, printing, etc., can solve the problem of screen deviation twice, and achieve the effect of solving angle deviation

Inactive Publication Date: 2012-06-20
ZHEJIANG FORTUNE ENERGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a method for measuring the overlay accuracy of the stencil to solve the problem of two stencil offsets caused by the existing measurement method

Method used

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  • Method for measuring screen plate overlay accuracy of solar cell
  • Method for measuring screen plate overlay accuracy of solar cell
  • Method for measuring screen plate overlay accuracy of solar cell

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Embodiment Construction

[0015] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0016] Such as figure 1 As shown, the stencil in the prior art generally includes a fine grid 2, a thin grid outer frame 3, and a main grid 6, wherein 1 is an alignment point.

[0017] to combine figure 1 , figure 2 and image 3 As shown, the invention discloses a method for measuring the overlay accuracy of a screen, comprising the following steps:

[0018] a Determine the coordinates of the center position of the four positioning points 1 of the first stencil, and the center line of the outer frame line 3 of the fine grid, and measure the distance from the center position of the four positioning points 1 of the first stencil to the center line of the outer frame line 3 of the fine grid vertical distance;

[0019] Determine the coordinates of the center position of the four positioning points 1 and the center line of the outer frame l...

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Abstract

The invention discloses a method for measuring the screen plate overlay accuracy of a solar cell. The method comprises the following steps of: a, determining the coordinates of the center positions of four positioning points of a first screen plate and the center line of a thin-grid outer frame line, and measuring the vertical distance from the center positions of the four positioning points of the first screen plate to the center line of the thin-grid outer frame line respectively; b, measuring the vertical distance from the center positions of the four positioning points of a second screen plate to the center line of the thin-grid outer frame line respectively in the same way; c, judging whether the X-axis and Y-axis offset distance of the second screen plate is within the required range of the overlay accuracy; and d, cross-connecting the four positioning points of the first screen plate to form a horizontal line and a vertical line, and measuring the parallelism or perpendicularity between a horizontal line or vertical line and the center line of corresponding outer frame line; measuring the parallelism or perpendicularity of the second screen plate in the same way; and obtaining the offset of the screen plate rotation position according to the difference between the two parallelisms or perpendicularities. According to the invention, the problem of X-axis and Y-axis offset of the sizes of two screen plates is solved, and angular offset caused by the rotation of the whole screen plate is avoided.

Description

technical field [0001] The invention relates to a method for measuring the engraving precision of a solar cell net plate. technical background [0002] Solar cells use the principle of photovoltaic effect to convert solar radiation energy into electrical energy. Solar cells are essentially a two-junction tube of a large-area semiconductor PN junction. Traditional solar cell preparation methods have little room for improving the conversion efficiency of solar cells. The selective emission junction SE process and the two-time printing process of the positive electrode can greatly improve the conversion efficiency of solar cells. Selective emitter junction SE process, a mature process at present, is generally formed by two diffusion methods. The basic principle is to divide the original single diffusion into two steps to form a re-expansion area and a light-expansion area. To form areas with different diffusion resistance, surface concentration and junction depth, it is nece...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B41F33/00B41F15/08
Inventor 王庆钱吴国强徐华浦
Owner ZHEJIANG FORTUNE ENERGY
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