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Detachable testing jig

A test fixture, detachable technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of short use time, scrapped fixtures cannot be used, parts cannot be reused, etc., and achieve the effect of low cost

Inactive Publication Date: 2012-08-01
游森溢
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] The traditional special-purpose test fixture is a pressing embedded needle implant fixture, and most of the parts cannot be reused after disassembly; taking the T030 probe of Taipei Probe Industrial Co., Ltd. as an example, the outer diameter of the opening of the casing of the probe is The maximum is 0.71mm, and the second outer diameter is 0.62mm, and the design hole diameter of the multi-layer needle-planting panel on the fixture is 0.65mm, so when the probe is pressed into the multi-layer needle-planting panel of the fixture, the probe The sleeve of the needle will be slightly deformed and tightly combined, so after the traditional special fixture is disassembled, most parts cannot be reused
With the rapid development of electronic products, the usable time of traditional special-purpose test fixtures is getting shorter and shorter. As long as the electronic parts are changed, the traditional special-purpose fixtures will be scrapped and cannot be used.

Method used

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Examples

Experimental program
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Effect test

Embodiment 1

[0034] The detachable test fixture according to a preferred embodiment of the present invention has the characteristics of quick assembly and reusability after disassembly; take the T030 probe of Taipei Probe Industrial Co., Ltd. as an example, the casing opening of the probe The maximum outer diameter at the center is 0.71mm, and the second outer diameter is 0.62mm. The aperture design size at the test point of the multi-layer needle planting panel 10 of the present invention is slightly larger than 0.71mm, which is larger than the maximum outer diameter of the sleeve pipe of the probe. When the needle is inserted into the multi-layer needle-implanting panel of the jig, the opening of the sleeve of the probe is not pressed into the multi-layer needle-implanting panel of the jig, so the sleeve of the probe will not be deformed, and the method of fixing the probe is to use At least one layer of the multi-layer needle-implanting panel presses the probes in the form of lateral dis...

Embodiment 2

[0036] The detachable test fixture according to another preferred embodiment of the present invention also has the characteristics of quick assembly and reusability after disassembly; taking the T040 probe of Taipei Probe Industrial Co., Ltd. as an example, the inner tube of the probe The outer diameter is 0.40mm, and the aperture design size at the test point of the multi-layer needle implantation panel 10 of the present invention is slightly larger than 0.40mm, which is larger than the maximum outer diameter of the casing of the probe, and the probe is embedded in the multi-layer needle implantation fixture When the panel is used, the inner tube is not pressed into the multi-layered needle-implanted panel of the jig, so the inner tube of the probe will not be deformed, and the method of fixing the probe is to use at least one layer of the multi-layered needle-implanted panel by lateral displacement. The pressing probe can also be embedded with a soft film in the multi-layer n...

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Abstract

The invention relates to the technical field of testing equipment, in particular to a detachable testing jig used on the testing equipment. The detachable testing jig comprises a multi-layer probe-embedded panel, a support, a base and a connector set, testing points designed according to a loop of a circuit are arranged in the multi-layer probe-embedded panel, probes are embedded into the testing points and can be fixed movably tightly by at least one layer of the multi-layer probe-embedded panel, the support is used for connecting the multi-layer probe-embedded panel with the base and providing strong supporting force to bear downward pressure of a tester, the base is used for fixing the tester, and the connector set is used for connecting the loop of the tester and the detachable testing jig. The detachable testing jig has the advantages of quick assembling and reusability after being detached, more than 90% of parts of the detached testing jig can be reused, and the detachable testing jig can be used for testing printed circuit boards, semiconductor packaging components and wafers and the like.

Description

technical field [0001] The invention relates to the technical field of test equipment, in particular to a test fixture used on the test equipment. Background technique [0002] The traditional special-purpose test fixture is a pressing embedded needle implant fixture, and most of the parts cannot be reused after disassembly; taking the T030 probe of Taipei Probe Industrial Co., Ltd. as an example, the outer diameter of the opening of the casing of the probe is The maximum is 0.71mm, and the second outer diameter is 0.62mm, and the design hole diameter of the multi-layer needle-planting panel on the fixture is 0.65mm, so when the probe is pressed into the multi-layer needle-planting panel of the fixture, the probe The sleeve of the needle will be slightly deformed and tightly bonded, so most of the parts cannot be reused after the traditional special jig is disassembled. With the rapid development of electronic products, the usable time of traditional special-purpose test fi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/02
Inventor 游森溢
Owner 游森溢