Linear birefringence measurement device and measurement method
A technology of linear birefringence and measurement devices, applied in the direction of measurement devices, optical devices, instruments, etc., can solve the problems of large measurement errors and the inability to realize the measurement of phase delay, and achieve the effect of convenient operation and simple structure
Active Publication Date: 2014-10-15
BEIJING GUOWANG OPTICAL TECH CO LTD
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However, this method cannot realize the measurement of the phase delay. Since the wave plate to be tested needs to be rotated continuously, the light intensity fluctuation of the light source will affect the curve of the outgoing light intensity with time, thus introducing a large measurement error.
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[0030] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.
[0031] see first figure 1 , figure 1 is the optical path diagram of the linear birefringence measuring device of the present invention. Depend on figure 1 It can be seen that the linear birefringence measuring device of the present invention is composed of a collimated light source 1 modulated by light intensity, a circular polarizer 2, a Wollaston prism 4, a double-quadrant detector 5 and a signal processing unit 6, and its positional relationship is: along In the forward direction of the beam of the intensity-modulated collimated light source 1 , there are the circular polarizer 2 , the Wollaston prism 4 and the double-quadrant detector 5 in sequence. The dual-quadrant photodetection unit 5 is electrically connected to the signal processing unit 6 and is not in the opt...
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The invention relates to a linear birefringence measuring device and a measuring method thereof. The linear birefringence measuring device comprises a collimating light source with light intensity modulation, a circular polarizer, a Wollaston prism, a dual-quadrant detector and a signal processing unit, wherein the position relation of elements is as follows: the circular polarizer, the Wollaston prism and the dual-quadrant detector are sequentially arranged along the forward direction of a light beam output from the collimating light source with light intensity modulation, the output end of the dual-quadrant detector is connected with the input end of the signal processing unit, and a spigot of a linear birefringence sample to be measured is arranged between the circular polarizer and the Wollaston prism. The linear birefringence measuring device has simple structure and convenience for measurement and operation; in the invention, the phase retardation and the fast axis azimuth angle of the linear birefringence sample can be simultaneously measured, and a measuring result is not influenced by the light intensity variation of the collimating light source.
Description
technical field [0001] The invention relates to the technical field of polarization measurement, in particular to a linear birefringence measuring device and a measuring method. technical background [0002] Linear birefringence is manifested as a phase difference between two beams of polarized light perpendicular to each other passing through an optical material. Phase retardation and fast axis azimuth are important optical parameters to characterize linear birefringence. In actual use, changes in the use conditions including the wavelength will cause a certain deviation in the phase retardation of the linear birefringent material relative to the nominal value. At the same time, usually the fast axis azimuth of linear birefringent materials is not indicated. Therefore, it is necessary to precisely measure the phase retardation and fast axis azimuth of linear birefringent materials during use. [0003] The prior art [1] (see Baoliang Wang.Linear birefringence measurement ...
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IPC IPC(8): G01N21/23G01B11/26
CPCG01N21/23G01N2021/216
Inventor 曾爱军陈贝石刘龙海郑乐行朱玲琳黄惠杰
Owner BEIJING GUOWANG OPTICAL TECH CO LTD