Light source and mask alternate optimization method based on Abbe vector imaging model
A technology of imaging model and optimization method, which is applied in the direction of photo-plate making process of originals, optics, and patterned surface for photomechanical processing, and can solve the problems of unsuitable photolithography system, no consideration of the difference in response to incident light of the light source of the projection system, Big deviation etc.
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[0161] Such as image 3 Shown is a schematic of the initial light source, the initial mask and its corresponding imaging in the photoresist. 301 is the initial light source pattern, white represents the luminous part, and black represents the non-luminous part. 302 is the initial mask pattern, which is also the target pattern, white represents the opening part, black represents the light blocking part, and its critical dimension is 45nm. 303 is imaging in the photoresist of the photolithography system after using 301 as the light source and 302 as the mask, and the imaging error is 2286 (where the imaging error is defined as the value of the objective function).
[0162] Such as Figure 4 Shown is a schematic diagram of the individual optimization results of the light source based on the Abbe vector imaging model, the initial mask pattern and its corresponding imaging in the photoresist. 401 is the individual optimization result of the light source based on the Abbe vector im...
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