System for acquiring and processing multi-type information based on cPCI bus

Abstract

The invention discloses a system for acquiring and processing multi-type information based on cPCI bus, comprising a front end device and a back end device which is connected with the front end device. The front end device integrates a separating and conditioning circuit for multipath signals, a first FPGA, a digital I/O card, an A/D acquisition card, a second FPGA and a single board computer, wherein the separating and conditioning circuit for multipath signals is used for acquiring and processing multipath time bunch signals, multipath simulation signals, multipath contact signals and multipath pulse signals. A controlling host of the back end device carries out remote controls over the acquiring and processing system, and carries out real-time/after judgments and analyses on the multipath time bunch signals, the multipath digital signals, the multipath contact signals and the multipath pulse signals, wherein the signals are stored in a single board computer. A signal which exceeds a preset corresponding range is displayed with highlight and alarmed. Thus, integration of multi-type and multipath signal acquisition based on cPCI bus and intelligence of data analysis are both realized. In addition, the system only comprises the front end device and the back end device, which is small in total volume.

Description

technical field [0001] The invention relates to an electronic measurement system, in particular to a cPCI bus-based multi-type information collection and processing system applicable to launch vehicle comprehensive testing. Background technique [0002] The large number and types of launch vehicle test signals lead to a wide variety of test equipment. At present, the test equipment widely used in the field of aerospace testing includes recorders, GPIB, CAMAC, VXI, etc. The large number and complex types are used in the test process of launch vehicles. However, there are many deficiencies and defects: [0003] First of all, two or more types of test equipment are often used in the test process of some subsystems of the launch vehicle, which makes the scale of the ground equipment large, and its own complexity brings about a decrease in reliability. During the test process, the test equipment fails occasionally. occurs, delaying the test cycle. Secondly, the various test equ...

AI Technical Summary

Problems solved by technology

[0003] First of all, two or more types of test equipment are often used in the test process of some subsystems of the launch vehicle, which makes the scale of the ground equipment large, and its own complexity brings about a decrease in reliability. During the test process, the test equipment fails occasionally. occurs, delaying the test cycle

Secondly, a large number of test equipment also brings difficulties to daily operation and learning of new operators, increasing the possibility of misoperation

Again, current test equipment is expensive and not easy to maintain

Especially for foreign special products and modules, if there is a failure, the purchase and maintenance cycle will be long, and it may even be out of stock

In addition, the data format acquired by each test equipment is complex, difficult to process and effectively use, the ability of automatic analysis and interpretation is poor, and the interpretation work is largely dependent on manpower

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